GB/T 41072-2021Surface chemical analysis—Electron spectroscopies—Guidelines for ultraviolet photoelectron spectroscopy analysis (English PDF)

Foreword

This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for Standardization Work Part 1. Structure and Drafting Rules of Standardization Documents" drafted.

Introduction

Photoelectron spectroscopy is one of the most important and effective analytical methods for studying the surface of solid materials. Equipped with X-ray Photoelectron Spectroscopy Ultraviolet photoelectron spectroscopy on the instrument can be used to obtain the energy distribution information of valence electrons in solid materials, which is an important method to study the work function and valence band of the material surface.

An efficient method for the structure (density of states), the energy resolution of which can reach about 100 meV, in the fields of solid state physics, surface science and materials science, etc. have important applications. As the research on semiconductor devices and photocatalytic materials becomes more and more extensive, their preparation and performance regulation require the valence electrons of the materials. The band structure can be accurately measured.

1 Scope

This document provides guidance for instrument operators to perform UV photoelectron spectroscopy analysis of solid material surfaces, including sample handling, spectrometer calibration Calibration and setup, spectral acquisition, and final reporting.

This document applies to the analysis of typical samples by operators of X-ray photoelectron spectrometers equipped with a vacuum ultraviolet light source.

2 Normative references

The contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, dated citations documents, only the version corresponding to that date applies to this document; for undated references, the latest edition (including all amendments) applies to this document document.

GB/T 22461-2008 vocabulary of surface chemical analysis

GB/T 22571-2017 Calibration of energy scale of X-ray photoelectron spectrometer for surface chemical analysis

GB/T 27025-2019 General requirements for the competence of testing and calibration laboratories

3 Terms and Definitions

Terms and definitions defined in GB/T 22461-2008 apply to this document.

4 Symbols and Abbreviations

The following symbols and abbreviations apply to this document.

ARPES: angle-resolved photoemission spectroscopy

EA: electron affinity

Eb: photoelectron binding energy

ECBM: bottom of conduction band

Ecutoff: Secondary electron cutoff

EF: Fermi level

Eg: forbidden band width (also called band gap)

EHOMO: HOMO energy level, the highest occupied molecular orbital (highest occupied molecular orbital)

Ek: kinetic energy of photoelectron

ELUMO: LUMO energy level, the lowest unoccupied molecular orbital (lowest unoccupied molecular orbital)

Evac: vacuum level

EVBM: valence band maximum

IP: ionization potential

UPS: Ultraviolet Photoelectron Spectroscopy

hnu: incident photon energy