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GB/T 35010.1-2018Semiconductor die products -- Part 1: Requirements for procurement and use (English PDF)

半导体芯片产品 第1部分:采购和使用要求

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Issued by

State Administration for Market Regulation, China National Standardization Administration

Level / Type

National · Recommended

Issue date

March 15, 2018

Implementation date

August 1, 2018

Scope

GB/T 35010.1-2018 is the English-translated version of 半导体芯片产品 第1部分:采购和使用要求.

GB/T 35010.1-2018 is the Chinese standard "Semiconductor die products -- Part 1: Requirements for procurement and use". Its scope clause reads: This part of GB/T 35010 is used to guide the production, supply and use of semiconductor chip products.

Semiconductor chip products include. - Wafers; - Single bare chip; - Chips and wafers with interconnect structures; - Small or partially packaged chips and wafers.

This section defines the minimum requirements for the data required for this type of chip product and also contributes to the design and procurement of chip-containing component products.

It contains The requirements for data are covered as follows. - product identification; - Product data; - Chip mechanical information; - Test, quality, assembly and reliability information; - Process, transport, and store information.

This section includes specific data used to describe the geometric, physical, and connection method data of the chip during R&D and manufacturing. Claim. Refer to Appendix A and Appendix B for related vocabularies and abbreviations.

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Document preview — GB/T 35010.1-2018

National Standard of the People's Republic of China

ICS
31.200
Classification
L 55

Issued by: State Administration for Market Regulation, China National Standardization Administration

Contents

  • Preface
  • 1 Scope
  • 2 Normative references
  • 3 Terms and Definitions
  • 3.1 Basic definition
  • 3.2 General Terms
  • 3.3 Semiconductor Manufacturing and Interconnection Terms
  • 4 General requirements
  • 5 Data Exchange
  • 6 Device Requirements
  • 6.1 Packet
  • 6.2 Identity and Source ID
  • 6.3 Function
  • 6.4 Physical Characteristics
  • 6.5 Ratings and Limitations
  • 6.6 Connection
  • 6.7 Document
  • 6.8 Delivery Form
  • 6.9 Simulation Modeling
  • 7 Bare Die and Wafer Requirements with/Without Linking
  • 7.1 Overview
  • 7.2 Identity
  • 7.3 Material
  • 7.4 Geometry
  • 7.5 Wafer Data
  • 8 The smallest packaged chip (MPD)
  • 8.1 Overview
  • 8.2 The number of outlets
  • 8.3 Outlet position
  • 8.4 Lead shape and size
  • 8.5 Device Size
  • 8.6 fixed height
  • 8.7 Packaging Materials
  • 8.8 Humidity Sensitivity
  • 8.9 Package Style Code
  • 8.10 Outline Drawing
  • 9 Quality, Test and Reliability
  • 9.1 Overview
  • 9.2 Factory Quality Level
  • 9.3 Electrical Characteristics
  • 9.4 Meets Standard
  • 9.5 Auxiliary Device Screening
  • 9.6 Product Status
  • 9.7 Test Characteristics
  • 9.8 Other Test Requirements
  • 9.9 Reliability
  • 10 Handling and Packaging
  • 10.1 General Requirements for All Chips
  • 10.2 Photolithography Version
  • 10.3 Wafer Diagram
  • 10.4 Special Project Requirements
  • 11 Save
  • 11.1 General Requirements
  • 11.2 Storage Term and Conditions
  • 11.3 Long-term storage
  • 11.4 Storage period
  • 12 Assembly
  • 12.1 General Requirements
  • 12.2 Bonding Methods and Materials
  • 12.3 Bonding Methods and Materials
  • 12.4 Bonding Limits
  • 12.5 Process Limits
  • Appendix A (Informative) Technical Terms
  • Appendix B (Informative) Abbreviations

1 Scope

This part of GB/T 35010 is used to guide the production, supply and use of semiconductor chip products. Semiconductor chip products include.

- Wafers;

- Single bare chip;

- Chips and wafers with interconnect structures;

- Small or partially packaged chips and wafers.

This section defines the minimum requirements for the data required for this type of chip product and also contributes to the design and procurement of chip-containing component products. It contains

The requirements for data are covered as follows.

- product identification;

- Product data;

- Chip mechanical information;

- Test, quality, assembly and reliability information;

- Process, transport, and store information.

This section includes specific data used to describe the geometric, physical, and connection method data of the chip during R&D and manufacturing.

Claim. Refer to Appendix A and Appendix B for related vocabularies and abbreviations.

2 Normative references

The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article

Pieces. For undated references, the latest version (including all amendments) applies to this document.

GB/T 25915.1-2010 Cleanrooms and related controlled environments - Part 1. Air cleanliness level (ISO 14644-1.1999,

IDT)

IEC 60050 (all parts) Electrotechnical terminology (International electrotechnicalvocabulary)

IEC 60191 (all parts) Mechanical standardization of semiconductor devices (Mechanicalstandardizationofsemiconductor

Devices)

IEC 60191-4.1999 Mechanical standardization of semiconductor devices - Part 4. Semiconductor device package outline coding and classification (Mechanicalstandardizationofsemiconductordevices-Part 4.Codingsystemandclassificationinto

Formsofpackageoutlinesforsemiconductordevicepackages)

Amendment1(2001) Amenduent2(2002)

IEC 61360-1 Standard data element types and related classification schemes for electrical components - Part 1. Definitions - Principles and methods (Standarddataelementtypeswithassociatedclassificationschemeforelectriccomponents-Part 1.

Definitions-Principlesandmethods)

IEC 62258-2 Semiconductor chip products Part 2. Data interchange formats (Semiconductor die products-Part 2.

Exchangedataformats)

IEC /T R62258-3 Semiconductor Chip Product Part 3. Guidelines for Handling, Packaging and Storage (Semiconductor dieprod- ucts-Part 3.Recommenduatinsforgoodpracticeinhandling,packingandstorage)

GB/T 46280.2 | GB/T 15651.7 | GB/T 43770 | GB/T 35010.5 | GB/T 35010.4 | GB/T 35010.3 | […]

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 64 pages — is available in the English PDF.

Referenced standards

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