GB/T 33834-2017Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens (English PDF)
微束分析 扫描电子显微术 生物试样扫描电子显微镜分析方法
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
May 31, 2017
Implementation date
April 1, 2018
Scope
GB/T 33834-2017 is the English-translated version of 微束分析 扫描电子显微术 生物试样扫描电子显微镜分析方法.
GB/T 33834-2017 is the Chinese national method for examining biological specimens in the scanning electron microscope.
It gives the basic principles, the equipment and materials, the preparation of the specimen, the observation and analysis steps, the statement of results, the handling of exceptions and the content of the analysis report, with an annex listing the formulation of commonly used fixatives.
It defines the electron gun, the electron beam, the accelerating voltage, the biological specimen, the secondary electron and the backscattered electron, noting that electrons below about 50 eV are counted as secondary.
Most animal, plant and microbial samples are wet and non-conductive and deform under the beam unless they are treated first. It applies to scanning electron microscopes of all types, cites GB/T 21636 and GB/T 23414, was issued on 31 May 2017 and has applied since 1 April 2018.
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Document preview — GB/T 33834-2017
National Standard of the People's Republic of China
- ICS
- 71.040.40
- Classification
- G 04
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- Preface
- Introduction
- 1 Scope
- 2 normative reference document
- 3 Terms and definitions
- 5 equipment and materials
- 6 Sample
- 7 Observation and Analysis Step
- 8 results statement
- 9 exception handling
- 10 Analysis Results Report
- Appendix A (informative) Formulation of commonly used fixatives
Foreword
This standard is drafted in accordance with the rules given in GB/T 1.1-2009.
Introduction
Scanning electron microscopy is an analytical instrument for observing the surface morphology and ultrastructure of solid samples, requiring sample drying and surface conduction.
Most biological samples (animals, plants and microbes) have a high moisture content, are not conductive, and are easily observed during scanning electron microscopy.
Shrinkage in the territory of deformation, resulting in the destruction of the true form of structure, and can not get good structural information. Therefore, the need to use chemical or physical Means to deal with biological samples in order to maximize the retention of the original sample for scanning electron microscopy observation and analysis. With the electron microscope Technology development, in the scanning electron microscopy biological samples on the basis of conventional chemical treatment methods, but also the development of a number of new physical processing techniques such as frozen Scanning electron microscopy technology, and in practice has been a good application. In order to regulate the preparation of scanning electron microscopy biological samples, the correct guidance of biological experiments Like the scanning electron microscopy analysis work, it is necessary to develop biological samples of scanning electron microscopy method of national standards.
1 Scope
This standard specifies the technical requirements and specifications for biological sample scanning electron microscopy analysis.
This standard applies to various types of scanning electron microscopy.
2 Normative reference documents
The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this document. For undated references, the latest edition (including all modifications) applies to this document.
GB/T 21636 Microbeam Analysis Electron Probe Microanalysis (EPMA) Terminology
GB/T 23414 Microbeam Analysis - Scanning Electron Microscopy Terminology
3 Terms and definitions
The terms and definitions defined in GB/T 23414 and GB/T 21636 and the following terms and definitions apply to this document.
3.1 Electron gun
The electron beam in the electron microscope consists of an emitter (heated tungsten wire, lanthanum hexaboride LaB6 filament, cold field or thermal field emission tip) Electronic accelerating system.
3.2 Electron beam
A beam of electrons focused by the electronic optical system onto the surface of the specimen.
3.3 Accelerated voltage
The potential difference between the filament and the anode is added to accelerate the electrons emitted from the electron source.
3.4 Biological sample
A variety of animal, plant and microbial samples with or in the form of life for scanning electron microscopy.
3.5 Secondary electron
Electrons emitted from the surface of the specimen due to incident electrons.
Note: Electrons with energy less than 50 eV are usually referred to as secondary electrons.
3.6 Backscatter electrons
Electrons emitted from the electron incident surface of the sample by the backscattering process.
Note: Often the energy of more than 50eV electrons called backscattered electrons.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.
Referenced standards
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Related Standards
GB/T 21636-2008 — Microbeam analysis - Electron Probe Micro Analysis (EPMA) - Vocabulary
GB/T 21636-2021 — Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
GB/T 23414-2009 — Microbeam analysis - Scanning electron microscopy - Vocabulary
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