GB/T 30859-2014Test method for warp and waviness of silicon wafers for solar cells (English PDF)
太阳能电池用硅片翘曲度和波纹度测试方法
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
July 24, 2014
Implementation date
April 1, 2015
Scope
GB/T 30859-2014 is the English-translated version of 太阳能电池用硅片翘曲度和波纹度测试方法.
GB/T 30859-2014 is the Chinese standard "Test method for warp and waviness of silicon wafers for solar cells". Its scope clause reads: This standard specifies a solar cell wafers (hereinafter referred to as wafers) Test Method warpage and waviness.
This standard applies to the test wafer warpage and waviness. Its clauses include terms and definitions.
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Document preview — GB/T 30859-2014
National Standard of the People's Republic of China
- ICS
- 77.040
- Classification
- H 21
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- 1 Scope
- 2 Normative references
- 3 Terms and Definitions
- 3.1 Contour filter
1 Scope
This standard specifies a solar cell wafers (hereinafter referred to as wafers) Test Method warpage and waviness.
This standard applies to the test wafer warpage and waviness.
2 Normative references
The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein
Member. For undated references, the latest edition (including any amendments) applies to this document.
GB/T 3505-2009 Geometrical product specifications (GPS) Surface texture Profile method - Terms, definitions and surface texture parameters
GB/T 6620 wafer warpage non-contact test method
GB/T 14264 semiconductor material terms
GB/T 16747-2009 Geometrical product specifications (GPS) Surface texture Profile method surface waviness vocabulary
GB/T 18777 Geometrical product specifications (GPS) Surface texture Profile method - Metrological characteristics of phase correct filters
GB/Z26958 (all parts) Geometrical product specifications (GPS) filter
3 Terms and Definitions
GB/T 3505-2009, terminology and GB/T 14264, GB/T 16747-2009, GB/T 18777 and GB/Z26958 defined
Definitions apply to this document. For ease of use, repeat the following list of GB/T 3505-2009 and GB/T 16747-2009 of a
These terms and definitions.
3.1 Contour filter
The outline is divided into short-wave and long-wave filter components. There are three filtering in measuring roughness, waviness and primary profile of the instrument , See Figure 1. They all have the same transmission characteristics GB/T 18777 stipulated, but different cutoff wavelengths.
[GB/T 3505-2009, the definition 3.1.1]
3.2
lambdas contour filter lambdasprofilefilter
Intersects the boundaries between the filter and the roughness of the waves shorter than its components determined to exist on the surface, shown in Figure 1.
[GB/T 3505-2009, the definition 3.1.1.1]
3.3
lambdac contour filter lambdacprofilefilter
Determine the boundaries of the intersection between roughness and waviness components of the filter shown in Figure 1.
[GB/T 3505-2009, the definition 3.1.1.2]
3.4
lambdaf contour filter lambdafprofilefilter
Determining the presence of the filter intersects the boundaries between the waviness on the surface of the component than its longer waves, shown in Figure 1.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.
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