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GB/T 17626.22-2017Electromagnetic compatibility (EMC) -- Testing and measurement techniques -- Radiated emissions and immunity measurements in fully anechoic rooms (FARs) (English PDF)

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Issued by

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China

Level / Type

National · Recommended

Issue date

December 29, 2017

Implementation date

July 1, 2018

Scope

GB/T 17626.22-2017 (Electromagnetic compatibility (EMC) -- Testing and measurement techniques -- Radiated emissions and immunity measurements in fully anechoic rooms (FARs)) is available as an English-translated PDF.

GB/T 17626.22-2017 — This section GB/T 17626 relates to the measurement of radiated emissions and radiated immunity of electronic and/or electrical equipment, provides that the full electric wave Test procedures for radiation emission and radiated immunity conducted in darkroom (FAR).

Note.

According to GB/Z 18509, this section is for the relevant product committees using the basic standards for electromagnetic compatibility, as described in guideline GB/Z 18509, product commissioner Will be responsible for determining the suitability of its EMC product class standard, TC77/SAC/TC246, CISPR/SAC/TC79 and its subcommittees (eg, SAC/SC7) are prepared to work with product committees in standard setting and revision cooperation to determine the specific EMC test in a particular product effect.

This section provides a common all-electric anechoic chamber radiation emission measurements and radiation immunity tests when the general confirmation procedures, subjects Equipment (EUT) test layout requirements and anechoic chamber measurement methods (see Appendix A and Appendix B).

As the basis of electromagnetic compatibility measurement standards, this section applies to specific devices or systems immunity test level or emission limits do not Specific provisions, the main goal is to provide the relevant domestic product board routine measurement procedures, and the specific requirements of the product and test conditions by the appropriate product committee to provide.

This section of the method applies to the 30MHz ~ 18GHz frequency range of radiation emission and immunity measurements.

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Document preview — GB/T 17626.22-2017

National Standard of the People's Republic of China

ICS: 33.100
Classification: L 06

Issued by: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China

Foreword
1 Scope
2 Normative references
3 Terms and definitions
4 Applications FAR measurements are measured
4.1 Radiated immunity test is measured
4.2 Radiation Emission Measurement Measured
5 FAR Site Confirmation/Calibration Procedure
5.1 Overview
5.2 FAR Site Confirmation/Calibration Configuration
5.3 Basic characteristics of test equipment and facilities
5.3.1 Overview
5.3.2 Test space
5.3.3 Broadband Antenna
5.3.4 Antenna connection cable
5.3.5 Test bench/table
5.3.6 Turntable
5.3.7 Antenna polarization automatic converter
5.3.8 Absorbing material arrangement
5.4 Definitions of Quantities Determined by FAR Confirmation Procedure
5.5 Sampling position for FAR
5.6 FAR Confirmation Procedure
5.6.1 Overview
5.6.2 Confirmation of Configuration Type 1
5.6.3 Confirmation of Configuration Type 2
5.6.4 Confirmation of Configuration Type 3
5.6.5 Confirmation of Configuration Type 4
5.6.6 Calculation of CdB and sdB, C for all configuration types
5.7 Confirm the request
6 Test layout
Appendix A (Normative) Radiation Immunity Test
Appendix B (Normative) Radiation Emission Measurement
Appendix C (Informative) Background on System Conversion Factors and One-shot Transmit Confirm/Immunity Calibration Methods
Appendix D (Informative) Measurement Uncertainty
References
Figure 1 Type 1 Confirmation/Calibration Block Diagram
Figure 2 Type 2 Confirmation/Calibration Block Diagram
Figure 3 Type 3 Confirmation/Calibration Block Figure
Figure 4 Type 4 Confirmation/Calibration Block Figure
Figure 5 Location of Sample Points for FAR Validation
Figure 6 desktop device test layout example
Figure 7. Benchtop Device Layout Example Top View
Figure 8 floor-standing equipment test arrangement example
Figure 9 Floor-mounted equipment test layout example Top view
Figure A.1 Definition of dmea in immunity test
Figure B.1 emission measurement dmeat definition
Figure D.1 Examples of factors influencing emission measurements
Figure D.2 Examples of factors that have an impact on the immunity test method
Table 1 different types of configuration necessary basic measuring instruments
Table 2 FAR validation guidelines
Table D.1 Uncertainties in measurement equipment and facilities for radiation emission measurements in the FAR in the frequency range 30 MHz to 1000 MHz
Table D.2 Uncertainty of measurement equipment and facilities for radiation emission measurements in the FAR in the frequency range 1 GHz to 18 GHz
TABLE D.3 IMMUNITY TEST SETS FOR FREQUENCY RANGES OF 30 MHz TO 1000 MHz IN FAR
Definite degree
TABLE D.4 IMMUNITY TESTING FOR FREQUENCY RANGES OF 1 GHz TO 18 GHz IN FAR Uncertainty of Measurement Equipment and Facilities for Level Settings

Foreword

GB/T 17626 "Electromagnetic compatibility test and measurement technology" for the electromagnetic compatibility series of standards. Has released the national standards include.

GB/T 17626.1-2006 electromagnetic compatibility test and measurement techniques Immunity Test Summary;

GB/T 17626.2-2006 Electromagnetic compatibility testing and measurement techniques Electrostatic discharge immunity test;

GB/T 17626.3-2016 Electromagnetic compatibility testing and measurement techniques RF electromagnetic field radiation immunity test;

GB/T 17626.4-2008 Electromagnetic Compatibility Testing and Measurement Technology; Electrical Fast Transient Burst Immunity Test;

GB/T 17626.5-2008 electromagnetic compatibility test and measurement techniques surge (impact) immunity test;

GB/T 17626.6-2008 Electromagnetic compatibility Testing and measurement techniques Immunity to conducted disturbances induced by radio frequency fields;

GB/T 17626.7-2017 Electromagnetic compatibility test and measurement technology Power supply systems and connected devices Harmonic, inter-harmonic wave measurement and Measuring instrument guide GB/T 17626.8-2006 Electromagnetic compatibility testing and measurement techniques Power frequency magnetic field immunity test;

GB/T 17626.9-2011 Electromagnetic compatibility test and measurement techniques pulsed magnetic field immunity test;

GB/T 17626.10-1998 Electromagnetic compatibility - Testing and measurement techniques; Damping magnetic field immunity test;

GB/T 17626.11-2008 electromagnetic compatibility test and measurement techniques voltage dips, short interruptions and voltage variations immunity test;

GB/T 17626.12-2013 Electromagnetic compatibility Testing and measurement techniques Ringing wave immunity test;

GB/T 17626.13-2006 Electromagnetic compatibility test and measurement technology AC power port harmonics, and power grid signal Low Frequency Immunity Test;

GB/T 17626.14-2005 Electromagnetic compatibility Testing and measurement techniques Voltage fluctuation immunity test;

GB/T 17626.15-2011 Electromagnetic compatibility testing and measurement techniques Scintillator function and design specifications;

GB/T 17626.16-2007 electromagnetic compatibility test and measurement techniques 0Hz ~ 150kHz common mode conducted disturbance immunity test;

GB/T 17626.17-2005 electromagnetic compatibility test and measurement techniques; DC power input port ripple immunity test;

GB/T 17626.18-2016 Electromagnetic compatibility Testing and measurement techniques Damped oscillatory wave immunity test;

GB/T 17626.20-2014 Electromagnetic compatibility test and measurement techniques Transmitted electromagnetic waves (TEM) waveguides in the launch and immunity test;

GB/T 17626.21-2014 Electromagnetic compatibility test and measurement techniques;

GB/T 17626.24-2012 electromagnetic compatibility test and measurement techniques HEMP conduction disturbance protection test methods;

GB/T 17626.27-2006 Electromagnetic compatibility testing and measurement techniques Three-phase voltage unbalance immunity test;

GB/T 17626.28-2006 Electromagnetic compatibility Testing and measurement techniques Power frequency variation Immunity test;

GB/T 17626.29-2006 Electromagnetic compatibility test and measurement techniques DC power input port voltage sags, short interruptions and Voltage variation immunity test;

GB/T 17626.30-2012 electromagnetic compatibility test and measurement techniques of power quality measurement methods;

GB/T 17626.34-2012 Electromagnetic compatibility test and measurement techniques Mains supply voltage greater than 16A per phase current Dips, short interruptions and voltage variations immunity tests.

This section GB/T 17626 Part 22.

This section drafted in accordance with GB/T 1.1-2009 given rules.

This section uses the translation method is equivalent to using IEC 61000-4-22:2010 "Electromagnetic Compatibility Part 4-22. Test and Measurement Technology Radiation Emissions and Immunity Measurements in Anechoic Chamber (FAR) ".

This section made the following editorial changes.

--- In line with the existing standard series, the standard name was changed to "electromagnetic compatibility test and measurement of radiation in the anechoic chamber Launch and immunity measurement. " this part of the National Radio Interference Standardization Technical Committee (SAC/TC79) and focal point.

This section drafted by the Ministry of Industry and Information Technology Electronics Industry Standardization Institute, China Institute of Metrology, China Electric Power Research Institute Institute, Shanghai Electric Apparatus Research Institute, Ministry of Industry and Information Technology Fifth Institute, Southeast University, Space Group 203, the National Radio Monitoring Center, Shaanxi Haitai Electronics Co., Ltd.

1 Scope

This section GB/T 17626 relates to the measurement of radiated emissions and radiated immunity of electronic and/or electrical equipment, provides that the full electric wave Test procedures for radiation emission and radiated immunity conducted in darkroom (FAR).

Note. According to GB/Z 18509, this section is for the relevant product committees using the basic standards for electromagnetic compatibility, as described in guideline GB/Z 18509, product commissioner Will be responsible for determining the suitability of its EMC product class standard, TC77/SAC/TC246, CISPR/SAC/TC79 and its subcommittees (eg, SAC/SC7) are prepared to work with product committees in standard setting and revision cooperation to determine the specific EMC test in a particular product effect.

This section of the method applies to the 30MHz ~ 18GHz frequency range of radiation emission and immunity measurements.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version applies to this article Pieces. For undated references, the latest edition (including all amendments) applies to this document.

GB/T 2900.82-2008 Electrotechnical terminology Instruments Instruments, systems, equipment and detectors (IEC 60050-394:2007, IDT) GB/T 4365-2003 Electrotechnical terminology Electromagnetic compatibility [IEC 60050 (161) .1990 A1.1997 A2.1998, IDT] GB/T 6113.101-2016 Radio disturbance and immunity measuring apparatus and methods - Part 1-1. Radio disturbance and Immunity Measuring Equipment Measuring Equipment (CISPR16-1-1.2010, IDT) GB/T 6113.104-2016 Radio disturbance and immunity measuring apparatus and methods - Part 1-4 - Radio disturbance and Immunity Measurement Equipment Radiation Harassment Measurement Antenna and Test Site (CISPR16-1-4.2012, IDT)

3 Terms and definitions

GB/T 4365-2003 defined and the following terms and definitions apply to this document.

Measuring equipment ancilaryequipment Connected to a measurement receiver or test/test signal generator to establish a harassing signal transmission path between the EUT and the measurement equipment (For example, current probes, voltage probes, artificial power networks, etc.).

EUT Aids associateequipment AE

......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 36 pages — is available in the English PDF.

Referenced standards

Normative references

GB/T 2900.82-2008 · IEC 60050

Cited by

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