GB/T 17473.2-2008Test methods of precious metals pastes used for microelectronics -- Determination of fineness (English PDF)

Foreword

This standard is an integrated revision of GB/T 17473-1998 " Test methods of

precious metal pastes used for thick film microelectronics" (all parts). It is

divided into 7 parts:

- GB/T 17473.1-2008 Test methods of precious metals pastes used for

microelectronics - Determination of solids content;

- GB/T 17473.2-2008 Test methods of precious metals pastes used for

microelectronics - Determination of fineness;

- GB/T 17473.3-2008 Test methods of precious metals pastes used for

microelectronics - Determination of sheet resistance;

- GB/T 174743.4-2008 Test methods of precious metals pastes used for

microelectronics - Determination of adhesion;

- GB/T 174743.5-2008 Test methods of pastes used for microelectronics -

Determination of viscosity;

- GB/T 174743.6-2008 Test methods of precious metal pastes used for

microelectronics - Determination of resolution;

- GB/T 174743.7-2008 Test methods of precious metals pastes used for

microelectronics - Determination of solderability and solderleaching

resistance.

This Part is Part 2 of GB/T 17473-2008.

This part replaces GB/T 17473.2-1998 "Test methods of precious metal pastes

used for thick film microelectronics - Determination of fineness".

Compared with GB/T 17473.2-1998, this Part mainly has the following changes:

- CHANGE the original standard name into "Test methods of precious metals

pastes used for microelectronics - Determination of fineness";

- In the Scope, DELETE the content that "non-precious metal pastes can

also be implemented with reference to this standard";

- CANCEL the requirements for testing specimen that "not less than 5 sets,

2 g per set"; it only requires that the specimen is thoroughly mixed well.

This Part was proposed by China Nonferrous Metals Industry Association.

This Part shall be under the jurisdiction of the National Non-ferrous Metals

Test methods of precious metals pastes used for

microelectronics - Determination of fineness

1 Scope

This Part specifies the scraper determination method for the fineness of

precious metal pastes, which are used in microelectronics technology.

This Part applies to the determination of the fineness of precious metal pastes,

for microelectronics technologies.

2 Normative references

The provisions in following documents become the provisions of this Part

through reference in this Part. For the dated references, the subsequent

amendments (excluding corrections) or revisions do not apply to this Part;

however, parties who reach an agreement based on this Part are encouraged

to study if the latest versions of these documents are applicable. For undated

references, the latest edition of the referenced document applies.

GB/T 8170 Rules of rounding off for numerical values & expression and

judgement of limiting values

3 Method principle

The paste is placed on the fineness meter, scraped from top to bottom by a

scraper. The size of the particles is determined visually, according to the

position of the longitudinal stripes in the groove.

4 Instruments and equipment