GB/T 11685-2003Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers (English PDF)
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Issued by
General Administration of Quality Supervision, Inspection and Quarantine of the People Republic of China
Level / Type
National · Recommended
Issue date
July 7, 2003
Implementation date
January 1, 2004
Scope
GB/T 11685-2003 (Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers) is available as an English-translated PDF.
GB/T 11685-2003 — This standard specifies the semiconductor X-ray sonar system and semiconductor X-ray energy dispersive spectroscopy method the amount of the main characteristics of the side.
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Document preview — GB/T 11685-2003
National Standard of the People's Republic of China
- ICS
- 27.120.01
- Classification
- F 80
- Replacing
- GB/T 8992-1988; GB/T 11685-1989
Issued by: General Administration of Quality Supervision, Inspection and Quarantine of the People Republic of China
Contents
- What this standard covers1
- Document data2
What this standard covers
This standard specifies the semiconductor X-ray sonar system and semiconductor X-ray energy dispersive spectroscopy method the amount of the main characteristics of the side. This standard applies to semiconductor X-ray sonar system and semiconductor X-ray energy dispersive properties of the main playing side of a.
Document data
International classification (ICS): 27.120.01.
Chinese classification (CCS): F80.
Estimated length of the Chinese original: 30,395 words.
Supersedes the earlier edition GB/T 8992-1988; GB/T 11685-1989.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 20 pages — is available in the English PDF.
Referenced standards
Cited by
- JB/T 12962.1-2016Energy dispersive X-ray fluorescence spectrometers - Part 1: General technical requirements
- JB/T 12962.2-2016Energy dispersive X-ray fluorescence spectrometers - Part 2: Elemental analyzers
- JB/T 12962.3-2016Energy dispersive X-ray fluorescence spectrometers - Part 3: Coating thickness analyzers
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