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SN/T 3347-2012Determination of silicon, manganese, phosphorus, chromium, and titanium in chrome-manganese-titanium, steel. Wave dispersive X-ray fluorescence spectrometry (English PDF)

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Issued by

General Administration of Customs

Level / Type

National · Recommended

Issue date

December 12, 2012

Implementation date

July 1, 2013

Scope

SN/T 3347-2012 (Determination of silicon, manganese, phosphorus, chromium, and titanium in chrome-manganese-titanium, steel. Wave dispersive X-ray fluorescence spectrometry) is available as an English-translated PDF.

SN/T 3347-2012 - This standard specifies the Cr-Mn steel titanium silicon, manganese, phosphorus, chromium, titanium content - Wavelength dispersive X-ray fluorescence spectrometric method.

This standard applies to the determination of chromium-manganese steel titanium silicon, manganese, phosphorus, chromium, titanium content in the measuring range in Table 1.

Table 1 Measuring range element Measurement range Silicon 0.069 ~ 0.48 Manganese 0.65 to 1.48 P 0.010 to 0.048 Chromium 0.30 to 1.93 Titanium 0.0074 ~ 0.18

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Document preview — SN/T 3347-2012

National Standard of the People's Republic of China

Issued by: General Administration of Customs

Contents

  • Foreword
  • 1 Scope
  • 2 Normative references
  • 3 Method summary
  • 4 Reagents and materials
  • 5 Instruments

Foreword

This standard was drafted in accordance with GB/T 1.1-2009 given rules.

This standard is proposed and managed by the National Certification and Accreditation Administration Committee.

This standard was drafted. People's Republic of China Shandong CIQ.

1 Scope

This standard specifies the Cr-Mn steel titanium silicon, manganese, phosphorus, chromium, titanium content - Wavelength dispersive X-ray fluorescence spectrometric method.

This standard applies to the determination of chromium-manganese steel titanium silicon, manganese, phosphorus, chromium, titanium content in the measuring range in Table 1.

Table 1 Measuring range

element

Measurement range

Silicon 0.069 ~ 0.48 Manganese 0.65 to 1.48 P 0.010 to 0.048 Chromium 0.30 to 1.93 Titanium 0.0074 ~ 0.18

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document.

GB/T 1031 surface roughness parameters and their values GB/T 16597 metallurgical product analysis X-ray Fluorescence Spectrometry General

3 Method summary

Analysis of the sample surface processed into a smooth plane, at selected measuring instrument conditions, measure the analyte in the sample characteristic spectrum X Ray fluorescence intensity, according to the quantitative relationship between X-ray fluorescence intensity and analyte content between the choice of methods and mathematical regression calibration mode, Calculate the amount of analyte.

4 Reagents and materials

4.1 detector gas (P10). 90% argon, 10% methane for gas-flow proportional counter.

4.2 Standard substance. spectrum with standard test block. Each element should be at least six standard material, the content should be a certain interval, and covers the test element Pigment measurement range.

5 Instruments

5.1 wavelength dispersive X-ray fluorescence spectrometer, in line with GB/T 16597 regulations.

......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 4 pages — is available in the English PDF.

Referenced standards

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