SN/T 3346-2012Determination of silicon, manganese, phosphorus, chromium, vanadium in chrome-vanadium steel. Wave dispersive X-ray fluorescence spectrometry (English PDF)
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Issued by
General Administration of Customs
Level / Type
National · Recommended
Issue date
December 12, 2012
Implementation date
July 1, 2013
Scope
SN/T 3346-2012 (Determination of silicon, manganese, phosphorus, chromium, vanadium in chrome-vanadium steel. Wave dispersive X-ray fluorescence spectrometry) is available as an English-translated PDF.
SN/T 3346-2012 - This standard specifies the CR-V in silicon, manganese, phosphorus, chromium, vanadium content - Wavelength dispersive X-ray fluorescence spectrometric method.
This standard applies to the determination of chromium vanadium steel silicon, manganese, phosphorus, chromium, vanadium content, measuring range in Table 1. Table 1 Measuring range element Measurement range Silicon 0.069 ~ 0.42 Manganese 0.13 to 0.98 P 0.010 to 0.048 Chromium 0.10 to 1.45 Vanadium 0.023 ~ 0.28
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Document preview — SN/T 3346-2012
National Standard of the People's Republic of China
Issued by: General Administration of Customs
Contents
- Foreword
- 1 Scope
- 2 Normative references
- 3 Method summary
- 4 Reagents and materials
- 5 Instruments
Foreword
This standard was drafted in accordance with GB/T 1.1-2009 given rules.
This standard is proposed and managed by the National Certification and Accreditation Administration Committee.
This standard was drafted. People's Republic of China Shandong CIQ.
1 Scope
This standard specifies the CR-V in silicon, manganese, phosphorus, chromium, vanadium content - Wavelength dispersive X-ray fluorescence spectrometric method.
This standard applies to the determination of chromium vanadium steel silicon, manganese, phosphorus, chromium, vanadium content, measuring range in Table 1.
Table 1 Measuring range
element
Measurement range
Silicon 0.069 ~ 0.42 Manganese 0.13 to 0.98 P 0.010 to 0.048 Chromium 0.10 to 1.45 Vanadium 0.023 ~ 0.28
2 Normative references
The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document.
GB/T 1031 surface roughness parameters and their values GB/T 16597 metallurgical product analysis X-ray Fluorescence Spectrometry General
3 Method summary
The measurement surface of the sample is processed into smooth plane, at selected measuring instrument conditions, measure the analyte in the sample characteristic spectrum X Ray fluorescence intensity, according to the quantitative relationship between X-ray fluorescence intensity and analyte content between the choice of methods and mathematical regression calibration mode, Calculate the amount of analyte.
4 Reagents and materials
4.1 detector gas (P10). 90% argon, 10% methane for gas-flow proportional counter.
4.2 Standard substance. spectrum with standard test block. Each element should be at least six standard material, the content should be a certain interval, and covers the test element Pigment measurement range.
5 Instruments
5.1 wavelength dispersive X-ray fluorescence spectrometer, in line with GB/T 16597 regulations.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 4 pages — is available in the English PDF.
Referenced standards
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