SJ/T 2354-2015Measuring methods for photodiodes of PIN、APD (English PDF)
PIN、雪崩光电二极管测试方法
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Issued by
Ministry of Industry and Information Technology
Level / Type
National · Recommended
Issue date
April 30, 2015
Implementation date
October 1, 2015
Scope
SJ/T 2354-2015 is the English-translated version of PIN、雪崩光电二极管测试方法.
SJ/T 2354-2015 — Measuring methods for photodiodes of PIN、APD
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Document preview — SJ/T 2354-2015
National Standard of the People's Republic of China
- ICS
- 31.18
- Classification
- L 54
- Replacing
- SJ/T 2354.1-1983; 2354.2-1983; 2354.3-1983; 2354.4-1983; 2354.5-1983; 2354.6-1983; 2354.7-1983; 2354.8-1983; 2354.9-1983; 2354.10-1983; 2354.11-1983; 2354.12-1983; 2354.13-1983; 2354.14-1983
Issued by: Ministry of Industry and Information Technology
Contents
- What this standard covers1
- Document data2
- Standards quoted by this document3
What this standard covers
This Standard specifies the test methods PIN, avalanche photodiode (hereinafter referred to as "diode") photovoltaic parameters.
Document data
International classification (ICS): 31.18.
Chinese classification (CCS): L54.
Estimated length of the Chinese original: 32,376 words.
Supersedes the earlier edition SJ/T 2354.1-1983; 2354.2-1983; 2354.3-1983; 2354.4-1983; 2354.5-1983; 2354.6-1983; 2354.7-1983; 2354.8-1983; 2354.9-1983; 2354.10-1983; 2354.11-1983; 2354.12-1983; 2354.13-1983; 2354.14-1983.
Standards quoted by this document
GB/T 2421.1-2008; GB/T 11499-2001; GB/T 15651
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 21 pages — is available in the English PDF.
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