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SJ/T 2214-2015Measuring methods for semiconductor photodiode and phototransistor (English PDF)

半导体光电二极管和光电晶体管测试方法

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Issued by

Ministry of Industry and Information Technology

Level / Type

National · Recommended

Issue date

April 30, 2015

Implementation date

October 1, 2015

Scope

SJ/T 2214-2015 is the English-translated version of 半导体光电二极管和光电晶体管测试方法.

SJ/T 2214-2015 — This Standard specifies the test method for a semiconductor photodiode and a phototransistor (hereinafter referred to as "devices") of optical parameters.

This Standard applies to testing semiconductor photodiode and phototransistor photoelectric parameters.

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Document preview — SJ/T 2214-2015

National Standard of the People's Republic of China

ICS: 31.08
Classification: L 54
Replacing: SJ 2214.1-1982; SJ 2214.2-1982; SJ 2214.3-1982; SJ 2214.4-1982; SJ 2214.5-1982; SJ 2214.6-1982; SJ 2214.7-1982; SJ 2214.8-1982; SJ 2214.9-1982; SJ 2214.10-1982

Issued by: Ministry of Industry and Information Technology

What this standard covers1
Document data2
Standards quoted by this document3

What this standard covers

This Standard specifies the test method for a semiconductor photodiode and a phototransistor (hereinafter referred to as "devices") of optical parameters. This Standard applies to testing semiconductor photodiode and phototransistor photoelectric parameters. This Standard is not applicable PIN, avalanche photodiode testing.

Document data

International classification (ICS): 31.08.

Chinese classification (CCS): L54.

Estimated length of the Chinese original: 25,295 words.

Supersedes the earlier edition SJ 2214.1-1982; SJ 2214.2-1982; SJ 2214.3-1982; SJ 2214.4-1982; SJ 2214.5-1982; SJ 2214.6-1982; SJ 2214.7-1982; SJ 2214.8-1982; SJ 2214.9-1982; SJ 2214.10-1982.

Standards quoted by this document

GB/T 2421.1-2008; GB/T 11499-2001

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 17 pages — is available in the English PDF.

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