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SJ/T 11777-2021Technical requirements and measurement methods for the calibrator of the semiconductor tube characteristic diagram instrument (English PDF)

半导体管特性图示仪校准仪技术要求和测量方法

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Issued by

Ministry of Industry and Information Technology

Level / Type

National · Recommended

Issue date

March 5, 2021

Implementation date

June 1, 2021

Scope

SJ/T 11777-2021 is the English-translated version of 半导体管特性图示仪校准仪技术要求和测量方法.

SJ/T 11777-2021 — This standard specifies the terms and definitions, technical requirements and measurement methods of semiconductor tube characteristic graph instrument calibrators.

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Document preview — SJ/T 11777-2021

National Standard of the People's Republic of China

Issued by: Ministry of Industry and Information Technology

What this standard covers1
Document data2

What this standard covers

This standard specifies the terms and definitions, technical requirements and measurement methods of semiconductor tube characteristic graph instrument calibrators.

Document data

Estimated length of the Chinese original: 14,140 words.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 9 pages — is available in the English PDF.

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