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SJ/T 11705-2018Ground and power supply impedance test method for microelectronics device packages (English PDF)

微电子器件封装的地和电源阻抗测试方法

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Issued by

Ministry of Industry and Information Technology

Level / Type

National · Recommended

Issue date

February 9, 2018

Implementation date

April 1, 2018

Scope

SJ/T 11705-2018 is the English-translated version of 微电子器件封装的地和电源阻抗测试方法.

SJ/T 11705-2018 — This standard specifies the series impedance test method for the ground and power supply terminals of complex, broadband microelectronic device packages.

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Document preview — SJ/T 11705-2018

National Standard of the People's Republic of China

Classification: L 55

Issued by: Ministry of Industry and Information Technology

What this standard covers1
Document data2

What this standard covers

This standard specifies the series impedance test method for the ground and power supply terminals of complex, broadband microelectronic device packages.

Document data

Chinese classification (CCS): L55.

Estimated length of the Chinese original: 6,610 words.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 4 pages — is available in the English PDF.

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