SJ/T 11631-2016Silicon solar cell appearance defects test methods (English PDF)
太阳能电池用硅片外观缺陷测试方法
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Issued by
Ministry of Industry and Information Technology
Level / Type
National · Recommended
Issue date
April 5, 2016
Implementation date
September 1, 2016
Scope
SJ/T 11631-2016 is the English-translated version of 太阳能电池用硅片外观缺陷测试方法.
SJ/T 11631-2016 — This standard specifies the test method for the appearance defects of silicon wafers for solar cells (hereinafter referred to as silicon wafers).
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Document preview — SJ/T 11631-2016
National Standard of the People's Republic of China
- Classification
- H 21
Issued by: Ministry of Industry and Information Technology
Contents
- What this standard covers1
- Document data2
What this standard covers
This standard specifies the test method for the appearance defects of silicon wafers for solar cells (hereinafter referred to as silicon wafers). The main contents include normative references, terms and definitions, method principles, interference factors, equipment, sample requirements, test environment, test procedures, precision and test reports.
Document data
Chinese classification (CCS): H21.
Estimated length of the Chinese original: 7,722 words.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 5 pages — is available in the English PDF.
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