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SJ/T 11628-2016Solar cell line characterization test method with die size and electrical (English PDF)

太阳能电池用硅片尺寸及电学表征在线测试方法

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Issued by

Ministry of Industry and Information Technology

Level / Type

National · Recommended

Issue date

April 5, 2016

Implementation date

September 1, 2016

Scope

SJ/T 11628-2016 is the English-translated version of 太阳能电池用硅片尺寸及电学表征在线测试方法.

SJ/T 11628-2016 — This standard specifies the non-contact on-line test method for the size and electrical characterization of silicon wafers for solar cells (hereinafter referred to as silicon wafers), including dimensions of wafer side length, diagonal length, adjacent side perpendicularity, thickness and total thickness.

Electrical characterization includes conductivity type, carrier recombination lifetime, and resistivity.

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Document preview — SJ/T 11628-2016

National Standard of the People's Republic of China

Classification: H 21

Issued by: Ministry of Industry and Information Technology

What this standard covers1
Document data2

What this standard covers

This standard specifies the non-contact on-line test method for the size and electrical characterization of silicon wafers for solar cells (hereinafter referred to as silicon wafers), including dimensions of wafer side length, diagonal length, adjacent side perpendicularity, thickness and total thickness. Electrical characterization includes conductivity type, carrier recombination lifetime, and resistivity. The main contents include normative references, terms and definitions, method summary, interference factors, equipment, sample requirements, test environment, test procedures, precision and test reports.

Document data

Chinese classification (CCS): H21.

Estimated length of the Chinese original: 9,953 words.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 7 pages — is available in the English PDF.

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