SJ/T 11577-2016SJ/T 11394-2009 semiconductor light-emitting diode test method Application Guide (English PDF)
SJ/T 11394-2009 半导体发光二极管测试方法应用指南
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Issued by
Ministry of Industry and Information Technology
Level / Type
National · Recommended
Issue date
January 15, 2016
Implementation date
June 1, 2016
Scope
SJ/T 11577-2016 is the English-translated version of SJ/T 11394-2009 半导体发光二极管测试方法应用指南.
SJ/T 11577-2016 — This standard specifies the details that SJ/T11394-2009 "Semiconductor LED Test Method" standard should pay attention to during actual measurement and operation.
The content of this standard can provide effective guidance for the measurement of LED light, color, electricity and other parameters, which can improve the accuracy and repeatability of measurement.
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Document preview — SJ/T 11577-2016
National Standard of the People's Republic of China
- Classification
- L 53
Issued by: Ministry of Industry and Information Technology
Contents
- What this standard covers1
- Document data2
What this standard covers
This standard specifies the details that SJ/T11394-2009 "Semiconductor LED Test Method" standard should pay attention to during actual measurement and operation. The content of this standard can provide effective guidance for the measurement of LED light, color, electricity and other parameters, which can improve the accuracy and repeatability of measurement. This standard applies to visible light LED device products, other LED device products can refer to implementation.
Document data
Chinese classification (CCS): L53.
Estimated length of the Chinese original: 9,995 words.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 7 pages — is available in the English PDF.
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