SJ/T 11501-2015Test method for determining crystal type of monocrystalline silicon carbide (English PDF)
碳化硅单晶晶型的测试方法
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Issued by
Ministry of Industry and Information Technology
Level / Type
National · Recommended
Issue date
April 30, 2015
Implementation date
October 1, 2015
Scope
SJ/T 11501-2015 is the English-translated version of 碳化硅单晶晶型的测试方法.
SJ/T 11501-2015 — This Standard specifies the use of Raman spectroscopy of single crystal silicon carbide crystalline types. This Standard applies to the determination of the silicon carbide single crystal type.
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Document preview — SJ/T 11501-2015
National Standard of the People's Republic of China
- ICS
- 29.045
- Classification
- H 83
Issued by: Ministry of Industry and Information Technology
Contents
- What this standard covers1
- Document data2
- Standards quoted by this document3
What this standard covers
This Standard specifies the use of Raman spectroscopy of single crystal silicon carbide crystalline types. This Standard applies to the determination of the silicon carbide single crystal type.
Document data
International classification (ICS): 29.045.
Chinese classification (CCS): H83.
Estimated length of the Chinese original: 12,195 words.
Standards quoted by this document
GB/T 14264
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 8 pages — is available in the English PDF.
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