SJ/T 11210-1999Measurement of quartz crystal unit parameters. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance Rland the calculation of other derived values of quartz crystal units, up to 30 MHz (English PDF)

SJ/T 11210-1999 is the English-translated version of 石英晶体元件参数的测量 第4部分：频率达30MHz石英晶体元件负载谐振频率fL和负载谐振电阻RL的测量方法及其他导出参数的计算.

SJ/T 11210-1999 is the Chinese industry standard "Measurement of quartz crystal unit parameters. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance Rland the calculation of other derived values of quartz crystal units, up to 30 MHz".

It was issued on August 26, 1999 by the Ministry of Information Industry of the People's Republic of China, and took effect on December 1, 1999. It is in force.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.

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