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SJ/T 10805-2018Semiconductor integrated circuits Measuring methods for voltage comparators (English PDF)

半导体集成电路电压比较器测试方法

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Issued by

Ministry of Industry and Information Technology

Level / Type

National · Recommended

Issue date

February 9, 2018

Implementation date

April 1, 2018

Scope

SJ/T 10805-2018 is the English-translated version of 半导体集成电路电压比较器测试方法.

SJ/T 10805-2018 — This standard specifies the electrical characteristics test method for semiconductor integrated circuit voltage comparators (hereinafter referred to as devices).

This standard is applicable to the geometric measurement of through-silicon via size. The through-silicon via can penetrate through the silicon wafer or partially through the silicon wafer.

The through-silicon via can contain metal conductors and other media, or it can contain metal conductors and others.

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Document preview — SJ/T 10805-2018

National Standard of the People's Republic of China

ICS: 31.200
Classification: L 55
Replacing: SJ/T 10805-2000

Issued by: Ministry of Industry and Information Technology

What this standard covers1
Document data2
Standards quoted by this document3

What this standard covers

This standard specifies the electrical characteristics test method for semiconductor integrated circuit voltage comparators (hereinafter referred to as devices). This standard is applicable to the geometric measurement of through-silicon via size. The through-silicon via can penetrate through the silicon wafer or partially through the silicon wafer. The through-silicon via can contain metal conductors and other media, or it can contain metal conductors and others. medium.

Document data

International classification (ICS): 31.200.

Chinese classification (CCS): L55.

Estimated length of the Chinese original: 32,340 words.

Supersedes the earlier edition SJ/T 10805-2000.

Standards quoted by this document

SJ/T 10734-1996

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 21 pages — is available in the English PDF.

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