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JJF 1712-2018Calibration Specification for Thin Layer Chromatography Scanners (English PDF)

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Issued by

State Administration for Market Regulation

Level / Type

National · Mandatory

Issue date

June 25, 2018

Implementation date

September 25, 2018

Scope

JJF 1712-2018 (Calibration Specification for Thin Layer Chromatography Scanners) is available as an English-translated PDF.

JJF 1712-2018 — This standard applies to the calibration of thin layer chromatography scanners (hereinafter referred to as instruments).

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Document preview — JJF 1712-2018

National Standard of the People's Republic of China

ICS
17.020
Classification
A 61

Issued by: State Administration for Market Regulation

Contents

  • Introduction (II)
  • 1 Scope (1)
  • 2 References (1)
  • 3 Terms (1)
  • 3.1 Ratio shift value (Rf) (1)
  • 4 Overview (1)
  • 5 Measurement characteristics (2)
  • 6 Calibration conditions (2)
  • 6.1 Laboratory environmental conditions (2)
  • 6.2 Standard materials and equipment for calibration (2)
  • 7 Calibration items and calibration methods (2)
  • 7.1 Preparation of thin-layer boards (2)
  • 7.2 Linearity error (3)
  • 7.3 Measurement repeatability (3)
  • 8 Calibration result expression (4)
  • 9 Re-study interval (4)
  • Appendix A Calibration Record Reference Format (5)
  • Appendix B Calibration Certificate (Inside) Reference Format (6)
  • Appendix C Preparation of Calibration Standard Solution (8)
  • Appendix D Example of Linear Error Measurement Uncertainty Evaluation (9)

1 Scope (1)

2 References (1)

3 Terms (1)

3.1 Ratio shift value (Rf) (1)

4 Overview (1)

5 Measurement characteristics (2)

6 Calibration conditions (2)

6.1 Laboratory environmental conditions (2)

6.2 Standard materials and equipment for calibration (2)

7 Calibration items and calibration methods (2)

7.1 Preparation of thin-layer boards (2)

7.2 Linearity error (3)

7.3 Measurement repeatability (3)

8 Calibration result expression (4)

9 Re-study interval (4)

Appendix A Calibration Record Reference Format (5)

Appendix B Calibration Certificate (Inside) Reference Format (6)

Appendix C Preparation of Calibration Standard Solution (8)

Appendix D Example of Linear Error Measurement Uncertainty Evaluation (9)

Introduction

This specification is based on JJF 1001-2011 "General Terms and Definitions of Measurement", JJF 1071-2010 "National Measurement the Rules for the Preparation of Calibration Specifications, JJF 1059.1-2012 "Measurement and Expression of Measurement Uncertainty" is the basis and basis.

Refer to GB/T 9008-2007 "Liquid Chromatography Terminology Column Chromatography and Planar Chromatography" for the content.

This specification is the first release.

TLC scanner calibration specification

1 Scope

This specification applies to the calibration of thin layer chromatography scanners (hereinafter referred to as instruments).

2 reference files

This specification refers to the following documents.

GB/T 9008-2007 Liquid chromatography terminology column chromatography and plane chromatography for dated references, only dated versions apply to this specification; undated quotations the latest version (including all amendments) applies to this specification.

3 terms

The terms and definitions defined in GB/T 9008-2007 and below apply to this specification.

3.1 ratio shift value (Rf). Rf value [GB/T 9008, 6.16] in the plane chromatography, the solute migration distance divided by the mobile phase migration distance can be expressed by the following formula.

In the formula.

Ds---solute migration distance, mm;

Dm---mobile phase migration distance, mm.

4 Overview

Thin layer chromatography is to place the sample solution on a thin layer plate and spread it with a developing agent in the unfolded container to make the sample contain Separation of ingredients. The basic principle of the instrument is. after the sample is spread on the thin layer plate, it forms spots or forms spots after color development.

Point, use a certain wavelength of light to illuminate the spot, perform spectral scanning on the spot, and obtain the specific shift value and absorb according to the scan.

The maximum absorption wavelength of the curve is qualitative, and the peak area or peak height of the spot is quantified.

The instrument is generally composed of a xenon lamp-tungsten lamp combined light source, a monochromator, a thin layer plate and a detector, and can be used for single beam, Dual beam or dual wavelength measurement, reflective mode and transmissive mode, linear scanning and sawtooth scanning. instrument the structure diagram is shown in Figure 1.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 11 pages — is available in the English PDF.

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