JJF 1252-2010Calibration specification for measuring instrument for laser paralleism of micrometers (English PDF)
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Issued by
General Administration of Quality Supervision, Inspection and Quarantine
Level / Type
National · Mandatory
Issue date
May 11, 2010
Implementation date
November 11, 2010
Scope
JJF 1252-2010 (Calibration specification for measuring instrument for laser paralleism of micrometers) is available as an English-translated PDF.
JJF 1252-2010 — This standard applies to parallel laser micrometer inspection instrument calibration.
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Document preview — JJF 1252-2010
National Standard of the People's Republic of China
- ICS
- 17.040
- Classification
- A 52
- Replacing
- JJG 828-1993
Issued by: General Administration of Quality Supervision, Inspection and Quarantine
Contents
- What this standard covers1
- Document data2
- Standards quoted by this document3
What this standard covers
This standard applies to parallel laser micrometer inspection instrument calibration.
Document data
International classification (ICS): 17.040.
Chinese classification (CCS): A52.
Estimated length of the Chinese original: 21,298 words.
Supersedes the earlier edition JJG 828-1993.
Standards quoted by this document
JJF 1001-1998; JJF 1094-2002; JJF 1088-2002; JJF 1130-2005; JJG 21-2008
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 14 pages — is available in the English PDF.
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JJF 1252-2010
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