JJF 1160-2006Calibration Specification of Small and Medium Scale Digital Integrated Circuit Testing System (English PDF)
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Issued by
General Administration of Quality Supervision, Inspection and Quarantine
Level / Type
National · Mandatory
Issue date
December 8, 2006
Implementation date
March 8, 2007
Scope
JJF 1160-2006 (Calibration Specification of Small and Medium Scale Digital Integrated Circuit Testing System) is available as an English-translated PDF.
JJF 1160-2006 — This standard applies to test clock frequencies less than 10MHz, no time measuring unit small and medium scale digital integrated circuit test equipment calibration.
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Document preview — JJF 1160-2006
National Standard of the People's Republic of China
- ICS
- 17.220
- Classification
- A 56
Issued by: General Administration of Quality Supervision, Inspection and Quarantine
Contents
- What this standard covers1
- Document data2
- Standards quoted by this document3
What this standard covers
This standard applies to test clock frequencies less than 10MHz, no time measuring unit small and medium scale digital integrated circuit test equipment calibration.
Document data
International classification (ICS): 17.220.
Chinese classification (CCS): A56.
Estimated length of the Chinese original: 14,123 words.
Standards quoted by this document
JJF 1059-1999
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 9 pages — is available in the English PDF.
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JJF 1160-2006
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