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JB/T 8268-2015Measurement method for surface defects of photoconductors for electrostatic copying (English PDF)

静电复印光导体表面缺陷测量方法

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Issued by

MIIT

Level / Type

Industry · Recommended

Issue date

April 30, 2015

Implementation date

October 1, 2015

Scope

JB/T 8268-2015 is the English-translated version of 静电复印光导体表面缺陷测量方法.

JB/T 8268-2015 is a recommended Chinese machinery industry standard that gives the method for measuring surface defects on the photoconductor used in electrostatic copying.

It states the measurement conditions, the measuring method itself and the form of the report.

What it applies to is the measurement of the blemishes in the background of the image on the photoconductors of xerographic equipment, printers, fax machines and multifunction machines among them, where such defects bear on the quality and the appearance of the copy.

It replaces JB/T 8268-1999. It quotes JB/T 8271 and JB/T 8273. The document is filed under the Chinese classification N47 and the international classification 37.100.10.

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Document preview — JB/T 8268-2015

National Standard of the People's Republic of China

ICS: 37.100.10
Replacing: JB/T 8268-1999

Issued by: Ministry of Industry and Information Technology of the People's Republic of China

Foreword
Scope
Normative references
About this standard
Classification and status

1 Foreword

JB/T 8268-2015 was issued by MIIT on 30 April 2015 and has been in force since 1 October 2015.

2 Scope

This standard is a recommended Chinese machinery industry standard that gives the method for measuring surface defects on the photoconductor used in electrostatic copying. It states the measurement conditions, the measuring method itself and the form of the report. What it applies to is the measurement of the blemishes in the background of the image on the photoconductors of xerographic equipment, printers, fax machines and multifunction machines among them, where such defects bear on the quality and the appearance of the copy. It replaces JB/T 8268-1999. It quotes JB/T 8271 and JB/T 8273. The document is filed under the Chinese classification N47 and the international classification 37.100.10.

3 Normative references

JB/T 8268-2015 cites the following standards, which apply in full or in part through the references made to them in its clauses.

JB/T 8271

JB/T 8273

4 About this standard

Issued by: MIIT

English translation: about 15 pages

5 Classification and status

International classification (ICS): 37.100.10

Prefix JB/T: recommended standard.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.

Referenced standards

Normative references

Similar standards

JB/T 8271-2015|JB/T 13028-2017|JB/T 13029-2017|JB/T 6798-2018|JB/T 13030-2017|JB/T 12151-2015

Editions of JB/T 8268

Edition	Title	Revision	Status
JB/T 8268-2015	Measurement method for surface defects of photoconductors for electrostatic copying	current edition	Current
JB/T 8268-1999	Measurement method for surface defects of photoconductors for electrostatic copying	previous edition	Superseded

This page sells the current edition, JB/T 8268-2015. Earlier editions are listed for reference only.

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