JB/T 8268-1999Standard test method for surface defect of photoconductor for electrostatic process (English PDF)
静电复印感光体表面缺陷 测量方法
JB/T 8268 | Evolution and historical versions
| Std ID | Title | Status |
|---|---|---|
| JB/T 8268-2015 | Standard test method for surface defect of photoconductor for electrostatic process | Valid |
| JB/T 8268-1999 | Standard test method for surface defect of photoconductor for electrostatic process | Obsolete |
JB/T 8268-1999 is obsolete. It has been replaced by JB/T 8268-2015. This page sells the obsolete edition, for projects and contracts that still cite it.
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Issued by
State Bureau of Machine Building Industry
Level / Type
Industry · Recommended
Issue date
August 6, 1999
Implementation date
January 1, 2000
Scope
JB/T 8268-1999 is the English-translated version of 静电复印感光体表面缺陷 测量方法.
JB/T 8268-1999 is the Chinese industry standard "Standard test method for surface defect of photoconductor for electrostatic process". It was issued on August 6, 1999 by the State Bureau of Machine Building Industry, and took effect on January 1, 2000. It is obsolete: it has been replaced by JB/T 8268-2015.
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Document preview — JB/T 8268-1999
National Standard of the People's Republic of China
Issued by: State Bureau of Machine Building Industry
Contents
- Document data
1 Document data
Sector: Machinery (industry standard).
Issuing body: State Bureau of Machine Building Industry.
Date of issue: 1999-08-06.
Date of implementation: 2000-01-01.
Status: obsolete, replaced by JB/T 8268-2015.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.
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JB/T 8268-1999
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