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GB/T 5095.2507-2021Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-7: Test 25g: Impedance, reflection coefficient, and voltage standing wave ratio (VSWR) (English PDF)

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Issued by

State Administration for Market Regulation, China National Standardization Administration

Level / Type

National · Recommended

Issue date

March 9, 2021

Implementation date

October 1, 2021

Scope

GB/T 5095.2507-2021 (Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-7: Test 25g: Impedance, reflection coefficient, and voltage standing wave ratio (VSWR)) is available as an English-translated PDF.

GB/T 5095.2507-2021 is the Chinese standard "Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-7: Test 25g: Impedance, reflection coefficient, and voltage standing wave ratio (VSWR)".

Its scope clause reads: This part of GB/T 5095 applies to interconnecting components, such as electrical connectors and cable assemblies within the scope of IEC TC48.

This section describes the test methods for measuring impedance, reflection coefficient and voltage standing wave ratio (VSWR) in the time and frequency domains.

Note. These test methods are written for professional testers who have professional knowledge in the electronics field and have been trained in the use of test equipment.

Because the measured value is strongly affected by the device and equipment, this method fails to describe all possible compound effects. Application theory provided by major equipment manufacturers The book provides a more in-depth professional explanation on how to use the equipment most appropriately.

It is essential that relevant standards should include Instructions and diagrams of how to arrange and perform the required measurements. Its clauses include scope and purpose; terms and definitions.

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Document preview — GB/T 5095.2507-2021

National Standard of the People's Republic of China

Classification: L 23

Issued by: State Administration for Market Regulation, China National Standardization Administration

Foreword
1 Scope and purpose
2 Terms and definitions
3 Test facility
3.1 Equipment
3.2 Device
4 Test sample
4.1 Description
5 Test procedure
5.1 Time domain
5.2 Frequency domain
6 Rules that should be stipulated by relevant standards
7 Test record file
Appendix A (Normative Appendix) Measuring System Rise Time
Appendix B (informative appendix) Determination of the proximal and distal ends of the sample
Appendix C (informative appendix) Calibration standard and test board standard circuit
Appendix D (informative appendix) TDR impedance curve description
Appendix E (informative appendix) Electrical terminal
Appendix F (Informative Appendix) Practical Guide---Variable Rise Time
Appendix G (informative appendix) Design basis for printed circuit boards for electronic measurement
Appendix H (informative appendix) Test signal transmitting component

1 Scope and purpose

This part of GB/T 5095 applies to interconnecting components, such as electrical connectors and cable assemblies within the scope of IEC TC48.

This section describes the test methods for measuring impedance, reflection coefficient and voltage standing wave ratio (VSWR) in the time and frequency domains.

Note. These test methods are written for professional testers who have professional knowledge in the electronics field and have been trained in the use of test equipment.

Because the measured value is strongly affected by the device and equipment, this method fails to describe all possible compound effects. Application theory provided by major equipment manufacturers

The book provides a more in-depth professional explanation on how to use the equipment most appropriately. It is essential that relevant standards should include

Instructions and diagrams of how to arrange and perform the required measurements.

2 Terms and definitions

The following terms and definitions apply to this document.

2.1 Measurement system rise time

Rise time measured by a device with no sample installed and with filtering (or normalization) function. Usually, the measurement is 10%~

90% level rise time.

2.2 Sampleenvironmentimpedance

The impedance caused by the device on the sample signal wire. The impedance is determined by the transmission line, terminal resistance, attached receiver and signal source.

And the parasitic effects of the device.

2.3 Reflection coefficient

The ratio of the reflected voltage to the incident voltage at any given point. The reflection coefficient is given by equation (1).

Gamma=

Vreflected

Vincident=

ZL-Z0

ZL Z0= s11 (1)

Where.

Gamma --- reflection coefficient;

Vreflected---reflected voltage;

Vincident---incident voltage;

ZL --- device or sample impedance;

Z0 --- sample environmental impedance.

Note. The symbol of the reflection coefficient in the time domain is usually rho, and the frequency domain is Gamma.

2.4 Impedance

At a certain frequency, the circuit presents all the obstacles to alternating current. It is a combination of measured resistance (R) and reactance (X) to

GB/T 17737.100 | GB/T 21711.1 | GB/T 5095.2504 | GB/T 5095.2503 | GB/T 5095.2502 | […]

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 51 pages — is available in the English PDF.

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