GB/T 5095.2505-2021Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-5: Test 25e: Return loss (English PDF)
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Issued by
State Administration for Market Regulation, China National Standardization Administration
Level / Type
National · Recommended
Issue date
March 9, 2021
Implementation date
October 1, 2021
Scope
GB/T 5095.2505-2021 (Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-5: Test 25e: Return loss) is available as an English-translated PDF.
GB/T 5095.2505-2021 — This part of GB/T 5095 applies to electrical connectors, sockets, cable assemblies or interconnecting systems. This section describes the frequency domain method and the time domain method used to measure return loss as a function of frequency.
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Document preview — GB/T 5095.2505-2021
National Standard of the People's Republic of China
- Classification
- L 23
Issued by: State Administration for Market Regulation, China National Standardization Administration
Contents
- 1 Scope1
- 2 Terms and definitions1
- 3 Test facility1
- 3.1 Equipment1
- 3.2 Device1
- 4 Test sample2
- 4.1 Description2
- 5 Test procedure2
- 5.1 General2
- 5.2 Device return loss3
- 5.3 Sample return loss measurement3
- 5.4 Time domain method3
- 6 Rules to be stipulated by relevant standards3
- 7 Test record file4
- Appendix A (Normative Appendix) Schematic Diagram of Installation and Equipment5
- Appendix B (Informative Appendix) Practical Guide9
Foreword
GB/T 5095 "Basic test procedures and measurement methods for electromechanical components for electronic equipment" is divided into several parts according to the test methods.
Part 25 of GB/T 5095 is a signal integrity test. The parts that have been released or planned to be released are as follows.
---Part 25-1.Test 25a. Crosstalk ratio;
---Part 25-2.Test 25b. Attenuation (insertion loss);
---Part 25-3.Test 25c. Rise time decay;
---Part 25-4.Test 25d. Transmission delay;
---Part 25-5.Test 25e. Return loss;
---Part 25-6.Test 25f. Eye diagram and jitter;
---Part 25-7.Test 25g. impedance, reflection coefficient and voltage standing wave ratio (VSWR);
--- Part 25-9.Signal Integrity Test Test 25i. Alien Crosstalk.
This part is part 25-5 of GB/T 5095.
This section was drafted in accordance with the rules given in GB/T 1.1-2009.
The translation method used in this part is equivalent to IEC 60512-25-5.2004 "Connector Test and Measurement for Electronic Equipment Part 25-5"
Minutes. Test 25e. Return Loss."
This section has made the following editorial changes.
---The name of the standard is changed from "Test and Measurement of Connectors for Electronic Equipment Part 25-5.Test 25e. Return Loss" to "Electrical
Basic test procedures and measurement methods for electromechanical components for sub-equipment-Part 25-5.Test 25e. Return loss;
---The original text "standard device (with sample), sample device (without sample)" in Figure A.1b) is an obvious clerical error, modified to "standard device (without sample)"
Sample), sample device (with sample)".
1 Scope
This part of GB/T 5095 applies to electrical connectors, sockets, cable assemblies or interconnecting systems.
This section describes the frequency domain method and the time domain method used to measure return loss as a function of frequency.
2 Terms and definitions
The following terms and definitions apply to this document.
2.1
Return loss
The ratio of the reflected signal measured by the sample to the input signal.
Note. It can be expressed in decibels (dB).
2.2
Sampleenvironmentimpedance
The impedance caused by the device on the sample signal wire. The impedance is determined by the transmission line, terminal resistance, attached receiver or signal source,
And the parasitic effects of the device.
3 Test facility
3.1 Equipment
3.1.1 Frequency domain
Use a network analyzer with a dynamic range suitable for the device under test (DUT). For differential measurement, a multi-port test position can be used
Set or balance-unbalanced converter network analyzer.
3.1.2 Time domain
Preferential use of time domain reflectometer (TDR), trigger pulse generator and appropriate fast Fourier transform (FFT) software.
3.2 Device
3.2.1 Overview
The environmental impedance of the sample should match the impedance of the test equipment. Unless otherwise specified in the detailed specification, in general, for single-ended measurements, the impedance
It is 50ohm, and the differential measurement is 100ohm. The schematic diagram of the device and equipment is shown in Appendix A.
3.2.2 Sample lead configuration
During each measurement, the excitation circuit should be installed in accordance with the provisions of the detailed specification. Within the specified environmental impedance of the sample, the
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 24 pages — is available in the English PDF.
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Related Standards
GB/T 5095.2506-2020 — Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-6: Test 25f: Eye pattern and jitter
GB/T 5095.2504-2021 — Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-4: Test 25d: Propagation delay
GB/T 5095.2507-2021 — Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-7: Test 25g: Impedance, reflection coefficient, and voltage standing wave ratio (VSWR)
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