GB/T 48096-2026Laser Doppler measurement method for dynamic displacement parameters of micro-electromechanical structures (English PDF)
微机电结构动态位移参数的激光多普勒测量方法
Also coversGB/T48096-2026 + GBT48096-2026
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
August 28, 2026
Implementation date
March 1, 2027
Scope
GB/T 48096-2026 is the English-translated version of 微机电结构动态位移参数的激光多普勒测量方法.
This standard describes a laser Doppler measurement method for dynamic displacement parameters of micro-electromechanical structures. Micro-electromechanical devices, often called MEMS, include sensors and actuators with very small moving parts, and measuring their motion calls for non-contact optical techniques. The document is intended for MEMS designers, foundries, metrology laboratories and researchers who characterize device behavior.
It takes effect on 1 March 2027, with the Chinese Academy of Sciences as the responsible body. It is a recommended national standard (GB/T), so its use is voluntary unless required by agreement. A shared national method helps manufacturers and customers compare measured displacement results and supports consistent reporting between labs. It is a newly issued method. Teams developing inertial sensors, resonators, micro mirrors or similar structures may find the method relevant when documenting dynamic performance.
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Document preview — GB/T 48096-2026
National Standard of the People's Republic of China
- ICS
- 17.180.99
- Classification
- L50
Issued by: State Administration for Market Regulation; Standardization Administration of China
Contents
- Foreword
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
Foreword
GB/T 48096-2026 is a recommended national standard (GB/T) of the People's Republic of China, issued on 28 August 2026 by the State Administration for Market Regulation and the Standardization Administration of China, with effect from 1 March 2027.
It is under the responsibility of the Chinese Academy of Sciences.
Classification: ICS 17.180.99; CCS L50.
1 Scope
This standard describes a laser Doppler measurement method for dynamic displacement parameters of micro-electromechanical structures. Micro-electromechanical devices, often called MEMS, include sensors and actuators with very small moving parts, and measuring their motion calls for non-contact optical techniques. The document is intended for MEMS designers, foundries, metrology laboratories and researchers who characterize device behavior.
It takes effect on 1 March 2027, with the Chinese Academy of Sciences as the responsible body. It is a recommended national standard (GB/T), so its use is voluntary unless required by agreement. A shared national method helps manufacturers and customers compare measured displacement results and supports consistent reporting between labs. It is a newly issued method. Teams developing inertial sensors, resonators, micro mirrors or similar structures may find the method relevant when documenting dynamic performance.
Remaining clauses in the full document
- 2 Normative references
- 3 Terms and definitions
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 20 pages — is available in the English PDF.
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