GB/T 46567.1-2025Intelligent computing - Test method for memristors - Part 1: Basic characteristics (English PDF)
智能计算 忆阻器测试方法 第1部分:基础特性
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
October 31, 2025
Implementation date
October 31, 2025
Scope
GB/T 46567.1-2025 is the English-translated version of 智能计算 忆阻器测试方法 第1部分:基础特性.
GB/T 46567.1-2025 is the Chinese standard "Intelligent computing - Test method for memristors - Part 1: Basic characteristics".
Its scope clause reads: This document specifies the requirements for memristor testing equipment and environmental conditions, and describes the basic characteristics of memristor reading, electrical preprocessing, enhancement, and suppression.
The test methods for sexuality were defined, and the requirements for test reports were specified. This document applies to the testing of fundamental characteristics of two-terminal bipolar memristors, including read, electrical preprocessing, enhancement, and suppression. Its clauses include terms and definitions.
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Document preview — GB/T 46567.1-2025
National Standard of the People's Republic of China
- ICS
- 31.080.99
- Classification
- L 40
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- Preface
- Introduction
- 1.Scope
- 2 Normative References
- 3.Terms and Definitions
- 4 Device under test
- 5.Testing Equipment and Environmental Conditions
- 5.1 Test Apparatus
- 5.2 Test Environment Conditions
- 6.Test Methods
- 6.1 Read
- 6.2 Electrical Pretreatment
- 6.3 Enhancement
- 6.4 Inhibition
- 7 Test Report
- Appendix A (Informative) Test Report Template
1 Scope
This document specifies the requirements for memristor testing equipment and environmental conditions, and describes the basic characteristics of memristor reading, electrical preprocessing, enhancement, and suppression.
The test methods for sexuality were defined, and the requirements for test reports were specified.
This document applies to the testing of fundamental characteristics of two-terminal bipolar memristors, including read, electrical preprocessing, enhancement, and suppression.
2 Normative references
This document does not contain any normative references.
3 Terms and Definitions
The following terms and definitions apply to this document.
3.1 memristor
A nonlinear electronic component that can remember the amount of charge or magnetic flux flowing through it by changes in resistance.
3.2 pre-synaptic voltage
Vpre
The voltage applied to the presynaptic neuron of the memristor.
3.3 post-synaptic voltage
Vpost
The voltage applied to the postsynaptic neuron of the memristor.
3.4 Rread
The resistance value of the memristor measured during the reading process (3.6) is the ratio of the reading voltage (3.7) to the reading current (3.8).
3.5 Gread
The conductance of the memristor measured during the reading process (3.6) is the ratio of the reading current (3.8) to the reading voltage (3.7).
3.6 Read
Operations to obtain the memristor resistance (3.4) or memristor conductance (3.5). […]
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 14 pages — is available in the English PDF.
Editions of GB/T 46567.1
| Edition | Title | Revision | Status |
|---|---|---|---|
| GB/T 46567.1-2025 | Intelligent computing - Test method for memristor - Part 1: Basic characteristics | current edition | Current |
This page sells the current edition, GB/T 46567.1-2025. Earlier editions are listed for reference only.
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