GB/T 45723-2025Test method for printed board - Monitoring of single plated-through hole (PTH)resistance change during temperature cycling (English PDF)
印制电路板测试方法 温度循环状态下镀覆孔单孔电阻的变化
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Issued by
State Administration for Market Regulation, China National Standardization Administration
Level / Type
National · Recommended
Issue date
May 30, 2025
Implementation date
December 1, 2025
Scope
GB/T 45723-2025 is the English-translated version of 印制电路板测试方法 温度循环状态下镀覆孔单孔电阻的变化.
GB/T 45723-2025 follows the resistance of a single plated-through hole in a printed board while the board is temperature-cycled, so the hole's endurance under thermo-mechanical stress can be judged.
The sample is a double-sided or multilayer board with a test pattern, four holes running top layer to bottom layer and wiring arranged for four-terminal resistance measurement.
The equipment is a reflow oven, a temperature cycling chamber and a resistance measuring and recording system, with high temperature wire soldered on. The procedure runs from preconditioning through the cycling to the judging of results, and the measuring current formula is given in SI units.
It applies to plated-through holes in printed boards and board assemblies, so board makers and their customers use it. A modified adoption of IEC 61189-3-719:2016, it was issued on 30 May 2025 and applies from 1 December 2025.
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Document preview — GB/T 45723-2025
National Standard of the People's Republic of China
- ICS
- 31.180
- Classification
- L 30
Issued by: State Administration for Market Regulation, China National Standardization Administration
Contents
- Preface
- 1 Scope
- 2 Normative references
- 3 Terms and Definitions
- 4 Sample
- 5 Equipment
- 5.1 Reflow soldering machine
- 5.2 Temperature cycle box
- 5.3 Resistance measurement and recording system
- 6 Procedure
- 6.1 Preprocessing
- 6.2 Temperature cycle test
- 6.3 Result determination
- 7 Report
- 8 Additional Information
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1: Structure and drafting rules for standardization documents" Drafting.
This document modifies the IEC 61189-3-719:2016 Test methods for electronic materials, printed boards and other interconnect structures and assemblies Part 1 Part 3-719.Test method for interconnect structures (printed boards) to determine the change in resistance of a single plated hole under temperature cycling conditions.
This document has made the following structural adjustments compared to IEC 61189-3-719:2016.
---5.3.1~5.3.3 correspond to 5.3 in IEC 61189-3-719:2016, and 5.3.4 is added;
---6.2.1~6.2.8 correspond to 6.2 in IEC 61189-3-719:2016;
---8.1 corresponds to the second paragraph of 5.3 in IEC 61189-3-719:2016;
---8.2 corresponds to Chapter 8 of IEC 61189-3-719:2016.
The technical differences between this document and IEC 61189-3-719:2016 and their reasons are as follows.
--- The normative reference documents have been adjusted to adapt to my country's technical conditions. The specific adjustments are as follows.
- GB/T 2036 replaced IEC 60194 (see Chapter 3);
- GB/T 2423.22 replaces IEC 60068-2-14 (see 5.2);
- The contents of IEC 60068-2-58:2015 shall be directly specified in the relevant specifications (see 6.1).
--- Added 4-terminal wiring requirements (see Chapter 4), and clarified that the wiring of the measurement wires must comply with the 4-terminal resistance measurement requirements.
--- Added low resistance tester (see 5.3.2), which can be used to replace constant current source and voltmeter for 4-terminal resistance test Measurement.
--- Added high temperature resistant wire (see 5.3.4) and high temperature resistant wire welding steps (see 6.2.1). High temperature resistant wire is required in the test. Make electrical connections.
--- The calculation formula for measuring current has been changed (see Chapter 8), and the calculation formula has been converted to the international system of units to comply with GB/T 1.1-2020 requirements. The following editorial changes were made to this document.
---The standard name has been changed in accordance with my country's printed circuit board professional standard system.
1 Scope
This document describes the test method for the resistance of plated-through holes in printed boards under temperature cycling conditions. Durability of plated-through holes under thermo-mechanical stress.
This document applies to plated-through holes in printed boards and printed board assemblies.
2 Normative references
The contents of the following documents constitute essential clauses of this document through normative references in this document.
For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to This document.
GB/T 2036 Terminology for printed circuits
GB/T 2423.22 Environmental testing Part 2: Test method Test N. Temperature change (GB/T 2423.22-2012, IEC 60068-2-14:2009, IDT)
3 Terms and definitions
The terms and definitions defined in GB/T 2036 apply to this document.
The test sample is a double-sided or multi-layer printed circuit board containing a test pattern. Figure 1 is an example of a local test pattern of a 6-layer printed circuit board.
If there are no special provisions in the relevant specifications, a specimen shall have the following characteristics.
a) There are 4 single plated-through holes connecting the top layer to the bottom layer (L1~LN) of the printed board, and the corresponding markings are on the drawing.
4 Samples
Note 1. Hole 1 on the left connects the top layer to the bottom layer (L1 to L6 for a 6-layer board).
Note 2. Hole 2 on the left connects the inner layers (L2~L3).
Note 3. The middle figure is a reference figure.
Note 4. The right side is the measurement wire connection hole, which is connected to the external measurement equipment.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 17 pages — is available in the English PDF.
Referenced standards
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