GB/T 44807.2-2025EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (English PDF)
集成电路电磁兼容建模 第2部分：集成电路电磁干扰特性仿真模型 传导发射建模（ICEM-CE）
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Issued by
State Administration for Market Regulation
Level / Type
National · Recommended
Issue date
December 31, 2025
Implementation date
April 1, 2026
Scope
GB/T 44807.2-2025 is the English-translated version of 集成电路电磁兼容建模 第2部分：集成电路电磁干扰特性仿真模型 传导发射建模（ICEM-CE）.
GB/T 44807.2-2025 — This document specifies a macromodel for an integrated circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board.
This model is commonly referred to as an integrated circuit (IC). Integrated circuit emission model - conducted emission (ICEM-CE). ICEM-CE macromodels can be used to model IC chips, functional blocks, and intellectual property (IP) blocks.
The ICEM-CE macro model can also be used to model both digital and analog ICs. Conducted emissions typically have two sources. - Conducted emissions generated by power terminals and ground reference structures; - Conducted emissions generated by input/output (I/O) terminals.
The ICEM-CE macromodel addresses both types of conducted emission sources in one approach. This document defines the structure and components of the macromodel used for electromagnetic interference (EMI) simulation and takes into account the internal behavior of the IC.
This document consists of two main parts. - The first part is the electrical description of the ICEM-CE macromodel elements and the specific requirements for related information; - Part Two proposes a general data exchange format based on XML called CEML, which is more practical and universal. The ICEM-CE is encoded in the form of simulated conducted emission.
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Document preview — GB/T 44807.2-2025
National Standard of the People's Republic of China
- ICS
- 31.200
- Classification
- L 56
Issued by: State Administration for Market Regulation
Contents
- Preface
- Introduction
- 1 Scope
- 2 Normative References
- 3 Terms, Definitions, Abbreviations, and Conventions
- 3.1 Terms and Definitions
- 3.2 Abbreviations
- 3.3 Agreement
- 4 Basic Principles
- 4.1 Overview
- 4.2 Conducted emission of nuclear energy (digital emission source)
- 4.3 Conducted emission of I/O behavior
- 4.4 Data Exchange Format
- 5 ICEM-CE Basic Components
- 5.1 Overview
- 5.2 Internal Behavior (IA)
- 5.3 Passive Distribution Network (PDN)
- 6 IC macromodel
- 6.1 Types of IC Macromodels
- 6.2 General IC Macro Model
- 6.3 Block-based IC macromodel
- 6.4 IC Macro Model Based on Sub-model
- 7 CEML format
- 7.1 Overview
- 7.2 CEML Structure
- 7.3 Global Keywords
- 7.4 Header Section
- 7.5 Lead Definition
- 7.6 SPICE Macro Model
- 7.7 Validity Section
- 7.8 PDN
- 7.9 IBC
- 7.10 IA
- 8 Parameter extraction requirements
- 8.1 Overview
- 8.2 Environmental limitations for extraction
- 8.3 IA Parameter Extraction
- 8.4 PDN Parameter Extraction
- 8.5 IBC Parameter Extraction
- Appendix A (Normative) Basic Definitions of XML Representation
- A.1 XML Fundamentals
- A.2 Keyword Requirements
- Appendix B (Normative) CEML Valid Keywords and Usage
- B.1 Root element keyword
- B.2 File header keyword
- B.3 Validity Keyword
- B.4 Global Keyword
- B.5 Lead Keyword
- B.6 Lead_definitions partial attributes
- B.7 Macromodels - Some Attributes
- B.8 Pdn Keyword Section
- B.9 Ibc Keyword
- B.10 Ia Keyword
- Appendix C (Informative) Example 60 of ICEM-CE macromodel in CEML format
- C.1 Overview
- C.2 PDN and IBC Sub-models
- C.3 IA Submodel
- C.4 Frequency Domain ICEM-CE in CEML
- C.5 Time-Domain ICEM-CE in CEML
- Appendix D (Informative) Conversion between Parameter Types
- D.1 Overview
- D.2 Conversion of Single-Port PDN Network Parameters
- D.3 Conversion of dual-port PDN network parameters
- Appendix E (Informative) Model Parameter Generation
- E.1 Overview
- E.2 Default structure and value
Foreword
This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1: Structure and Drafting Rules of Standardization Documents".
Drafting.
This document is Part 2 of GB/T 44807 "Electromagnetic Compatibility Modeling of Integrated Circuits". GB/T 44807 has already published the following parts.
---Part 1: General Modeling Framework;
---Part 2: Simulation Model of Electromagnetic Interference Characteristics of Integrated Circuits - Conducted Emission Modeling (ICEM-CE);
---Part 3: Simulation Model of Electromagnetic Interference Characteristics of Integrated Circuits - Radiated Emission Modeling (ICEM-RE).
This document is equivalent to IEC 62433-2:2017 "Electromagnetic compatibility modeling of integrated circuits - Part 2: Simulation of electromagnetic interference characteristics of integrated circuits".
True Model Conducted Emission Modeling (ICEM-CE) Please note that some content in this document may involve patents. The issuing organization of this document assumes no responsibility for identifying patents.
This document was proposed by the Ministry of Industry and Information Technology of the People's Republic of China.
This document is under the jurisdiction of the National Integrated Circuit Standardization Technical Committee (SAC/TC599).
Introduction
To standardize electromagnetic compatibility (EMC) modeling for integrated circuits and to provide integrated circuit manufacturers with EMC modeling methods and requirements, GB/T 44807 "Integrated Circuit Electromagnetic Compatibility Modeling" specifies the general framework, methods and requirements for integrated electromagnetic compatibility modeling, and is proposed to consist of 6 parts.
---Part 1: General Modeling Framework. The purpose is to define the framework and methods for macro-modeling of electromagnetic compatibility (EMC) in integrated circuits, and to define commonly used terminology.
Definitions, different modeling methods, and standardized requirements and data exchange formats for each model category.
---Part 2: Simulation Model of Electromagnetic Interference Characteristics of Integrated Circuits - Conducted Emission Modeling (ICEM-CE). The purpose is to specify the characteristics of integrated circuits...
Circuit conducted emission modeling methods and requirements.
---Part 2-1.Black Box Modeling Theory for Conducted Emissions. The aim is to provide a black box modeling theory for conducted emissions in integrated circuits.
theory.
---Part 3: Simulation Model of Electromagnetic Interference Characteristics of Integrated Circuits - Radiated Emission Modeling (ICEM-RE). The purpose is to specify the characteristics of integrated circuits...
Circuit radiated emission modeling methods and requirements.
---Part 4: Simulation Model of Radio Frequency Immunity Characteristics of Integrated Circuits - Conducted Immunity Modeling (ICIM-CI). The purpose is to specify...
Integrated circuit conducted immunity modeling methods and requirements.
---Part 6: Simulation Model of Pulse Immunity Characteristics in Integrated Circuits - Conducted Pulse Immunity Modeling (ICIM-CPI). The purpose is to...
The method and requirements for modeling the conducted pulse immunity of integrated circuits are specified.
Electromagnetic compatibility modeling of integrated circuits Part 2: Simulation of Electromagnetic Interference Characteristics of Integrated Circuits Model-guided emission modeling (ICEM-CE)
1 Scope
This document specifies a macromodel for an integrated circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board. This model is commonly referred to as an integrated circuit (IC).
Integrated circuit emission model - conducted emission (ICEM-CE).
ICEM-CE macromodels can be used to model IC chips, functional blocks, and intellectual property (IP) blocks.
The ICEM-CE macro model can also be used to model both digital and analog ICs.
Conducted emissions typically have two sources.
- Conducted emissions generated by power terminals and ground reference structures;
- Conducted emissions generated by input/output (I/O) terminals.
The ICEM-CE macromodel addresses both types of conducted emission sources in one approach.
This document defines the structure and components of the macromodel used for electromagnetic interference (EMI) simulation and takes into account the internal behavior of the IC.
This document consists of two main parts.
- The first part is the electrical description of the ICEM-CE macromodel elements and the specific requirements for related information;
- Part Two proposes a general data exchange format based on XML called CEML, which is more practical and universal.
The ICEM-CE is encoded in the form of simulated conducted emission.
2 Normative references
The contents of the following documents, through normative references within the text, constitute essential provisions of this document. Dated citations are not included.
For references to documents, only the version corresponding to that date applies to this document; for undated references, the latest version (including all amendments) applies.
This document.
GB/T 7343-2017 Measurement method for suppression characteristics of passive EMC filtering devices (IEC/CISPR17.2011, IDT) IEC TS62433-1:2011 Electromagnetic compatibility modeling of integrated circuits – Part 1: General modeling framework (EMCICmodeling-Note. GB/T 44807.1-2024 Electromagnetic compatibility modeling of integrated circuits - Part 1: General modeling framework (IEC 62433-1:2019, IDT)
3 Terms, Definitions, Abbreviations and Conventions
3.1 Terms and Definitions
The following terms and definitions apply to this document.
3.1.1
External terminalexternalterminal the terminals of the IC macromodel connect the model to the external environment of the IC.
Example. Power supply pins and input/output pins.
Note. In this document, the name of each external terminal begins with "ET".
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 96 pages — is available in the English PDF.
Referenced standards
Normative references
- GB/T 7343-2017Methods of measurement of the suppression characteristics of passive EMC filtering devices
- GB/T 44807.1-2024EMC IC modelling - Part 1: General modelling framework
IEC/CISPR17.2011 · IEC 62433
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Related Standards
GB/T 44807.1-2024 — EMC IC modelling - Part 1: General modelling framework
GB/T 7343-2017 — Methods of measurement of the suppression characteristics of passive EMC filtering devices
GB/T 44807.3-2025 — EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
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