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GB/T 44807.1-2024EMC IC modelling - Part 1: General modelling framework (English PDF)

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Issued by

State Administration for Market Regulation, China National Standardization Administration

Level / Type

National · Recommended

Issue date

October 26, 2024

Implementation date

October 26, 2024

Scope

GB/T 44807.1-2024 (EMC IC modelling - Part 1: General modelling framework) is available as an English-translated PDF.

GB/T 44807.1-2024 — This document specifies the framework and method for macro-modeling of electromagnetic compatibility (EMC) of integrated circuits (ICs) and specifies the requirements of other parts of IEC 62433.

Definitions of common terms, different modeling approaches, and standardized requirements and data exchange formats for each model category.

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Document preview — GB/T 44807.1-2024

National Standard of the People's Republic of China

ICS
31.200
Classification
L 56

Issued by: State Administration for Market Regulation, China National Standardization Administration

Contents

  • Preface
  • Introduction
  • 1 Scope
  • 2 Normative references
  • 3 Terms, Definitions and Abbreviations
  • 3.1 Terms and Definitions
  • 3.2 Abbreviations
  • 3.3 Agreement
  • 4 Model Definition
  • 4.1 Overview
  • 4.2 Conducted Emission Model
  • 4.3 Radiated Emission Model
  • 4.4 Conducted Immunity Model
  • 4.5 Radiated Immunity Model
  • 4.6 Conducted Pulse Immunity Model
  • 5 Modeling Methods
  • 5.1 General Principles
  • 5.2 Black Box Modeling Method
  • 5.3 Equivalent Circuit Modeling Method
  • 5.4 Other modeling methods
  • 6 Model Description Requirements
  • 7 Model Data Exchange Format
  • 7.1 Overview
  • 7.2 IC_EMCML Structure
  • 7.3 IC_EMCML Composition
  • Appendix A (Normative) Requirements for the ICEMC Model
  • Appendix B (Normative) Basic Definitions of XML Representation
  • Appendix C (Normative) IC_EMCML Valid Keywords and Usage
  • Reference

Foreword

This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1: Structure and drafting rules for standardization documents" Drafting.

This document is Part 1 of GB/T 44807 "Electromagnetic Compatibility Modeling of Integrated Circuits". GB/T 44807 has been published in the following parts.

--- Part 1: General modeling framework.

This document is equivalent to IEC 62433-1:2019 "Electromagnetic compatibility modeling of integrated circuits Part 1: General modeling framework".

Introduction

To standardize the electromagnetic compatibility modeling of integrated circuits and provide electromagnetic compatibility modeling methods and requirements for integrated circuit manufacturers, GB/T 44807 specifies the general framework, methods and requirements for electromagnetic compatibility modeling of integrated circuits, and is intended to consist of six parts.

--- Part 1: General modeling framework. The purpose is to specify the framework and methods for macro-modeling of electromagnetic compatibility of integrated circuits, common terms Definitions, different modeling approaches as well as standardized requirements and data exchange formats for each model category.

--- Part 2: Integrated Circuit Electromagnetic Interference Characteristics Simulation Model Conducted Emission Modeling (ICEM-CE). The purpose is to specify the integrated Circuit conducted emission modeling methods and requirements.

--- Part 2-1.Black box modeling theory of conducted emissions. The purpose is to give the black box modeling of integrated circuit conducted emissions theory.

--- Part 3: Integrated Circuit Electromagnetic Interference Characteristics Simulation Model Radiated Emission Modeling (ICEM-RE). The purpose is to specify the integrated Circuit radiated emissions modeling methods and requirements.

--- Part 4: Integrated Circuit RF Immunity Characteristics Simulation Model Conducted Immunity Modeling (ICIM-CI). The purpose is to specify Integrated circuit conducted immunity modeling methods and requirements.

--- Part 6: Integrated Circuit Pulse Immunity Characteristics Simulation Model Conducted Pulse Immunity Modeling (ICIM-CPI). The purpose is to Specifies the modeling methods and requirements for conducted pulse immunity of integrated circuits.

Integrated Circuit Electromagnetic Compatibility Modeling Part 1: General modeling framework

1 Scope

This document specifies the framework and method for macro-modeling of electromagnetic compatibility (EMC) of integrated circuits (ICs) and specifies the requirements of other parts of IEC 62433.

Definitions of common terms, different modeling approaches, and standardized requirements and data exchange formats for each model category.

2 Normative references

The contents of the following documents constitute the essential clauses of this document through normative references in this document.

For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to this document.

IEC 62433 (all parts) Integrated Circuit Electromagnetic Compatibility Modeling (EMCICmodeling) Interchange (7-Bit ASCII)]

3 Terms, definitions and abbreviations

3.1 Terms and Definitions

The following terms and definitions apply to this document.

3.1.1

Macromodel for simulating conducted electromagnetic emissions from ICs.

Note. ICEM-CE macromodels are used to model IC chips, functional blocks, and intellectual property (IP) blocks.

3.1.2

Macromodel for simulating radiated electromagnetic emissions from ICs.

3.1.3

Macromodel of an IC used to simulate the sensitivity level of conducted disturbances applied to the IC pins.

3.1.4

A macro model of an IC used to simulate the IC's sensitivity level to external radiated disturbances.

3.1.5

nity;ICIM-CPI

Macromodel of an IC used to simulate the sensitivity level of conducted pulse disturbances applied to the IC pins.

......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 57 pages — is available in the English PDF.

Referenced standards

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