GB/T 43774-2024Test for stress of flat panel display substrate glass—Point scan method (English PDF)

Foreword

This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1: Structure and drafting rules for standardization documents" Drafting.

Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents.

This document was proposed and coordinated by the National Technical Committee for Semiconductor Equipment and Materials Standardization (SAC/TC203).

This document was drafted by: Bengbu Zhongguang Technology Co., Ltd., China Building Materials Glass New Materials Research Institute Group Co., Ltd., China Building Materials China Academy of Materials Science Co., Ltd., Wuhan University of Technology, Glass New Materials Innovation Center (Anhui) Co., Ltd., Chengdu Zhongguang Optoelectronics Technology Co., Ltd.

Company, China Electronics Technology Standardization Institute, Dongxu Group Co., Ltd., Hebei Guangxing Semiconductor Technology Co., Ltd., Shenzhen Yinuocheng Electronics Co., Ltd., Shenzhen Sidike Technology Co., Ltd.

The main drafters of this document are: Peng Shou, Zhang Chong, Cao Zhiqiang, Jin Liangmao, Nie Lanjian, Shen Yuguo, Ma Liyun, Guan Min, Qian Xuejun, Duan Meijiang, Ren Hongcan, Zhou Xin, Zhang Xiaodong, Zhu Mingliu, Cheng Huifeng, Zheng Jijie, Zhu Yongqian, Wang Jing, Li Peiyue, Fu Bo, Wu Yiran, Zhao Junsha, Cao Kewei, Chen Jiarui, Li Qing, Hu Hengguang, Zhang Yujiao, Nie Da, Huang Haocheng.

Point scanning method for stress test of flat panel display substrate glass

1 Scope

This document gives the experimental principle of the point scanning method for determining the stress of the flat panel display substrate glass, describes the test equipment, test Test conditions, sample requirements, test steps, result expression, and test report.

This document is applicable to the stress test of flat panel display substrate glass with a thickness of 0.3mm~1.1mm and specifications of 11th generation and below.

Other glass materials are used for reference.

2 Normative references

GB/T 7962.5

GB/T 20919

GB/T 36405

3 Terms and definitions

The terms and definitions defined in GB/T 7962.5, GB/T 36405 and the following apply to this document.

4 Test Principle

The photoelastic modulator is used to apply a certain phase difference to the linearly polarized light, and an optical path difference is formed when the sample has stress. The stress of the sample is the optical path difference.

The ratio of the difference to the photoelastic constant is given by formula (1). sigma = (1) Where.

sigma---stress value, unit is megapascal (MPa);

delta---Optical path difference, in nanometers per centimeter (nm/cm);

B---Photoelastic constant, the unit is nanometer per centimeter megapascal [nm/(cm-MPa)].

5 Experimental equipment