GB/T 42208-2022Nanotechnologies—Measurement of nanoparticle size in multiphase system—Image method of transmission electron microsopy (English PDF)
纳米技术 多相体系中纳米颗粒粒径测量 透射电镜图像法
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
December 30, 2022
Implementation date
July 1, 2023
Scope
GB/T 42208-2022 is the English-translated version of 纳米技术 多相体系中纳米颗粒粒径测量 透射电镜图像法.
GB/T 42208-2022 is the Chinese national method for measuring the size of nanoparticles dispersed in a multiphase system from transmission electron microscope images.
It covers the imaging principle and image processing, the sample requirements and sample preparation, the test steps from sample loading to image acquisition, the image analysis and the way results are expressed, measurement uncertainty and the test report, with informative annexes on a solid metal multiphase system and a nanocomposite.
It defines nanoparticles as solid particles of 1 nm to 100 nm and separates bright-field from dark-field imaging.
Clause 1 applies it to particle size and size distribution in solid-phase multiphase systems, and extends it to nanoparticles in colloids and biological tissues only where the sample preparation meets the requirements for electron microscope observation. Issued on 30 December 2022, it has applied since 1 July 2023.
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Document preview — GB/T 42208-2022
National Standard of the People's Republic of China
- ICS
- 17.180.01
- Classification
- N 33
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- Preface
- Introduction
- 1 Scope
- 2 Normative references
- 3 Terms and Definitions
- 4 Principle
- 4.1 Overview
- 4.2 Imaging principle of transmission electron microscope
- 4.3 Image processing
- 5 sample
- 5.1 Sample requirements
- 5.2 Sample preparation method
- 6 Test Step
- 6.1 General requirements
- 6.2 Sample loading
- 6.3 Instrument preparation
- 6.4 Image Acquisition
- 7 Particle size measurement
- 7.1 Overview
- 7.2 Image Analysis
- 7.3 Results representation
- 8 Measurement uncertainty
- 9 Test report
- Appendix A (Informative) Solid Metal Multiphase System Example
- Appendix B (Informative) Nanocomposite Example
- Reference
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for Standardization Work Part 1: Structure and Drafting Rules for Standardization Documents" drafting.
Introduction
Due to the surface effect, quantum size effect, volume effect and quantum tunneling effect of nanomaterials, the material exhibits properties that traditional solids do not have.
Some chemical, electrical, magnetic, optical and other specific properties. At the same time, limited by the size, the occasions where nanomaterials are used alone are limited, and there are often In the material matrix, a multiphase system is formed to increase the overall material properties.
Due to the small particle size, large specific surface area and large surface energy of nanoparticles, they are easy to agglomerate, which makes it difficult to characterize and evaluate them in multiphase systems. price. Transmission electron microscopy is a characterization device that uses electron beam imaging through thin film samples to reveal the internal morphology and structure of the sample. prepare. It can not only observe the microscopic shape of the sample, but also characterize the internal structure of the observed area. Therefore, the TEM matching diagram Image analysis techniques can be used to measure the particle size of nanoparticles in multiphase systems.
The particle size measurement of nanoparticles in the multiphase system has a great role in optimizing the structure of materials and improving the performance of materials.
1 Scope
This document describes the use of transmission electron microscopy image processing and analysis techniques for particle size measurement of nanoparticles dispersed in multiphase systems. Quantitative method.
This document is applicable to particle size measurement and particle size distribution of nanoparticles in solid-phase multiphase systems.
This document is also applicable to the size of nanoparticles in colloids and biological tissues when the sample preparation meets the requirements of transmission electron microscopy observation. Measurement.
2 Normative references
The contents of the following documents constitute the essential provisions of this document through normative references in the text. Among them, dated references For documents, only the version corresponding to the date is applicable to this document; for undated reference documents, the latest version (including all amendments) is applicable to this document.
GB/T 21649.1 Particle Size Analysis Image Analysis Method Part 1: Static Image Analysis Method
GB/T 30544.4 Nanotechnology Terminology Part 4: Nanostructured Materials
3 Terms and Definitions
The following terms and definitions defined in GB/T 30544.4 apply to this document.
3.1 Nanoparticles
Solid particles with a particle size ranging from 1nm to 100nm. [Source: GB/T 16418-2008, 2.1.6]
3.2 Disperse
The process of distributing nanoparticles in a heterogeneous system.
3.3 brightfield imaging; BF
A transmission electron microscope technique for electron illumination and imaging in which the electron beam penetrates the sample, using an objective diaphragm located on the back focal plane and selected to Imaging with transmitted waves. [Source: GB/T 30543-2014, 3.3]
3.4 Darkfield like
darkfieldimaging; DF A transmission electron microscope technique for electron illumination and imaging in which the electron beam penetrates the sample, using an objective diaphragm located on the back focal plane and selected to Imaging with diffracted waves. [Source: GB/T 30543-2014, 3.4]
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.
Referenced standards
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Related Standards
GB/T 21649.1-2024 — Particle size analysis - Image analysis methods - Part 1: Static image analysis methods
GB/T 30544.4-2019 — Nanotechnologies -- Vocabulary -- Part 4: Nanostructured materials
GB/T 7251.4-2026 — Low-voltage switchgear and controlgear assemblies - Part 4: Particular requirements for assemblies for construction sites (ACS)
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