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GB/T 38783-2020Method of coating thickness determination for precious metal composites by scanning electron microscope (English PDF)

贵金属复合材料覆层厚度的扫描电镜测定方法

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Issued by

SAMR; SAC

Level / Type

National · Recommended

Issue date

June 2, 2020

Implementation date

May 1, 2021

Scope

GB/T 38783-2020 is the English-translated version of 贵金属复合材料覆层厚度的扫描电镜测定方法.

GB/T 38783-2020 is the Chinese standard "Method of coating thickness determination for precious metal composites by scanning electron microscope". Its scope clause reads: This standard specifies the measurement method for the coating thickness of various precious metal composites by scanning electron microscope.

This standard is applicable to the measurement of coating thickness of 10 nm ~ 200 µm. Its clauses include terms and definitions; method summary; equipment; test method; processing of test data; test report.

It was issued by the State Administration for Market Regulation on JUNE 02, 2020 and took effect on APRIL 01, 2021.

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Document preview — GB/T 38783-2020

National Standard of the People's Republic of China

ICS
77.120.99
Classification
H 15

Issued by: State Administration for Market Regulation; Standardization Administration of the PRC

Contents

  • Foreword3
  • 1 Scope4
  • 2 Normative references4
  • 3 Terms and definitions4
  • 4 Method summary5
  • 5 Equipment5
  • 6 Test method6
  • 7 Processing of test data14
  • 8 Test report14

1 Scope

This standard specifies the measurement method for the coating thickness of various precious metal composites by scanning electron microscope.

This standard is applicable to the measurement of coating thickness of 10 nm ~ 200 µm.

2 Normative references

The following documents are essential to the application of this document. For the dated documents, only the versions with the dates indicated are applicable to this document; for the undated documents, only the latest version (including all the amendments) is applicable to this standard.

GB/T 13298-2015 Inspection methods of microstructure for metals

GB/T 16594 General rules for measurement of length in micron scale by

GB/T 17359 Microbeam analysis - Quantitative analysis using energy dispersive spectrometry

GB/T 17722-1999 Gold-plated thickness measurement by SEM

GB/T 20307 General rules for nanometer-scale length measurement by […]

3 Terms and definitions

The following terms and definitions apply to this document.

3.1 Focused ion beam; FIB

The metal ions (Ga ions) produced by the liquid metal ion source are accelerated and focused by an ion gun to form an ion beam.

5 Equipment

5.2 Ion sputtering apparatus.

5.3 Metallurgical microscope.

5.4 Ultrasonic cleaning machine.

5.5 Metallographic inlay machine.

6 Test method

6.1 Inlay method

6.1.1 Sampling

Cut the portion of precious metal composite profile or device to be tested which has coating. The coating at the sampling position shall be complete and representative.

6.1.2 Preparation before inlay

The removed composite material sample is cleaned by an ultrasonic cleaning machine and dried for use. If the coating thickness is less than 10 µm, the sample surface shall be plated with a 10 µm thick nickel or other metal protective layer. The nickel-plating formula shall be implemented in accordance with the provisions of Appendix A in GB/T 17722-1999.

6.1.3 Inlay

Inlay the composite material samples in accordance with 6.1.3.1 of GB/T 17722-1999.

6.1.4 Grinding and polishing of the sample section

According to Chapter 3 of GB/T 13298-2015, take out the inlaid specimen; grind and polish to meet the requirements of metallographic samples.

6.2 FIB method

6.2.1 Sampling

Perform in accordance with 6.1.1.

6.2.2 Installation of samples
6.2.2.1 Horizontal installation method

Install the sample horizontally on the surface of the flat sample stage, with the coated side of the sample facing up. according to GB/T 17359. For multi-layer coatings, it is necessary to confirm whether there is a case where the coating is not visible. If the coating is found to be not visible, metallographic etching (inlaid method) or FIB irradiation etching (FIB) can be used to make the coating appear.

6.4 Getting photos

6.4.1 Inlay method

Move the coating to be tested to the center of the field of view. Select a suitable magnification to obtain the secondary electron image or backscattered electron image. The captured image shall have a good contrast effect; the composite interface is obvious; the coating can be measured. Ensure that the thickness of the measured coating is enlarged to more than 5 mm.

6.4.2 FIB method

The horizontal installation method is to shoot when the sample stage is tilted 52°. For the sample of the pre-tilt installation method, the sample stage is first tilted back to 0°; the cross-sectional position is rotated 180° and then tilted 54°, as shown in Figure 7. Move the coating to be tested to the center of the field of view; select the appropriate magnification; obtain the secondary electron image (SE) or backscattered electron image (BSE). The captured image shall have a good contrast effect; the composite interface is obvious; the coating is measurable. Ensure that the thickness of the measured coating is enlarged to more than 5 mm.

a) Horizontal installation method b) Pre-tilt installation method

6.5 Measurement of local coating thickness

Coating stag e for […]

......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.

Referenced standards

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