GB/T 35391-2017Non-destructive testing - Spatial resolution phantom for industrial computed tomography (CT) testing (English PDF)
无损检测 工业计算机层析成像(CT)检测用空间分辨力测试卡
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
December 29, 2017
Implementation date
April 1, 2018
Scope
GB/T 35391-2017 is the English-translated version of 无损检测 工业计算机层析成像(CT)检测用空间分辨力测试卡.
GB/T 35391-2017 is the Chinese standard "Non-destructive testing - Spatial resolution phantom for industrial computed tomography (CT) testing". Its scope clause reads: This standard specifies the industrial computer tomography (CT) testing with the classification of space resolution test card, technical requirements, test methods.
This standard applies to the type of space resolution test card inspection and factory inspection, the standard can also be used as a basis for acceptance of user orders. Its clauses include terms and definitions; classification, type and logo.
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Document preview — GB/T 35391-2017
National Standard of the People's Republic of China
- ICS
- 19.100
- Classification
- J 04
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
Contents
- Foreword
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 classification, type and logo
- 5 technical requirements
- 6 test methods
- 7 inspection rules
- 8 signs and labels
- 9 Packaging, transportation and storage
1 Scope
This standard specifies the industrial computer tomography (CT) testing with the classification of space resolution test card, technical requirements, test methods.
This standard applies to the type of space resolution test card inspection and factory inspection, the standard can also be used as a basis for acceptance of user orders.
2 Normative references
The following documents for the application of this document is essential. For dated references, only the dated version applies to this article
Pieces. For undated references, the latest edition (including all amendments) applies to this document.
Terminology for nondestructive testing - Industrial computer tomography (CT) testing
3 Terms and definitions
GB/T 12604.12 defined terms and definitions apply to this document.
4 classification, type and logo
4.1 Classification
4.1.1
This standard applies to the spatial resolution test card can be classified as follows.
4.1.2
According to the different structure can be divided into.
a) line card, according to the level of resolution is divided into three kinds.
1) III level line card
2) II level line card
3) Class I line pair card;
b) round hole card or thin card, according to the aperture or wire size is divided into two kinds.
1) II level hole card or II level card
2) I level hole card or class I filament card;
c) Disk Card.
4.1.3
According to different materials can be divided into.
a) steel space resolution test card, code-named FE;
d) Silica spatial resolution test card, code-named SI;
e) Other metal space resolution test card, abbreviated name with the English name.
4.2 type
4.2.1 pair of cards
The line card is a standard test piece used to test the spatial resolution of industrial CT systems. It is made of steel, silicon or any other material […]
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.
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