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GB/T 35391-2017Non-destructive testing - Spatial resolution phantom for industrial computed tomography (CT) testing (English PDF)

无损检测 工业计算机层析成像(CT)检测用空间分辨力测试卡

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Issued by

SAMR; SAC

Level / Type

National · Recommended

Issue date

December 29, 2017

Implementation date

April 1, 2018

Scope

GB/T 35391-2017 is the English-translated version of 无损检测 工业计算机层析成像(CT)检测用空间分辨力测试卡.

GB/T 35391-2017 is the Chinese standard "Non-destructive testing - Spatial resolution phantom for industrial computed tomography (CT) testing". Its scope clause reads: This standard specifies the industrial computer tomography (CT) testing with the classification of space resolution test card, technical requirements, test methods.

This standard applies to the type of space resolution test card inspection and factory inspection, the standard can also be used as a basis for acceptance of user orders. Its clauses include terms and definitions; classification, type and logo.

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Document preview — GB/T 35391-2017

National Standard of the People's Republic of China

ICS
19.100
Classification
J 04

Issued by: State Administration for Market Regulation; Standardization Administration of the PRC

Contents

  • Foreword
  • 1 Scope
  • 2 Normative references
  • 3 Terms and definitions
  • 4 classification, type and logo
  • 5 technical requirements
  • 6 test methods
  • 7 inspection rules
  • 8 signs and labels
  • 9 Packaging, transportation and storage

1 Scope

This standard specifies the industrial computer tomography (CT) testing with the classification of space resolution test card, technical requirements, test methods.

This standard applies to the type of space resolution test card inspection and factory inspection, the standard can also be used as a basis for acceptance of user orders.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version applies to this article

Pieces. For undated references, the latest edition (including all amendments) applies to this document.

Terminology for nondestructive testing - Industrial computer tomography (CT) testing

3 Terms and definitions

GB/T 12604.12 defined terms and definitions apply to this document.

4 classification, type and logo

4.1 Classification

4.1.1

This standard applies to the spatial resolution test card can be classified as follows.

4.1.2

According to the different structure can be divided into.

a) line card, according to the level of resolution is divided into three kinds.

1) III level line card

2) II level line card

3) Class I line pair card;

b) round hole card or thin card, according to the aperture or wire size is divided into two kinds.

1) II level hole card or II level card

2) I level hole card or class I filament card;

c) Disk Card.

4.1.3

According to different materials can be divided into.

a) steel space resolution test card, code-named FE;

d) Silica spatial resolution test card, code-named SI;

e) Other metal space resolution test card, abbreviated name with the English name.

4.2 type

4.2.1 pair of cards

The line card is a standard test piece used to test the spatial resolution of industrial CT systems. It is made of steel, silicon or any other material […]

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.

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