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GB/T 32988-2016Synthetic quartz crystal wafer for optical low pass filter (OLPF) (English PDF)

人造石英光学低通滤波器晶片

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Issued by

SAMR; SAC

Level / Type

National · Recommended

Issue date

October 13, 2016

Implementation date

September 1, 2017

Scope

GB/T 32988-2016 is the English-translated version of 人造石英光学低通滤波器晶片.

GB/T 32988-2016 is the Chinese standard "Synthetic quartz crystal wafer for optical low pass filter (OLPF)". Its scope clause reads: This standard specifies the artificial quartz optical low-pass filter chip terminology and definition, classification, requirements, test methods, inspection rules and packaging, Logo, delivery conditions.

This standard applies to artificial quartz optical low-pass filter chips. Its clauses include normative reference documents; terms and definitions.

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Document preview — GB/T 32988-2016

National Standard of the People's Republic of China

ICS: 31.160
Classification: L 21

Issued by: State Administration for Market Regulation; Standardization Administration of the PRC

Preface
1 Scope
2 normative reference document
3 Terms and definitions
4 grading
5 requirements
5.1 chip
5.2 Size and angle
5.3 Chip surface flaws
5.4 Chip face deviation
6 Test Method
6.1 Inclusions and cracks
6.2 Stripes
6.3 Size
6.4 tangential and angular deviation
6.5 chamfer and chamfer
6.6 verticality
6.7 TV5
6.8 Surface flaws
6.9 Face deviation
7 Inspection rules
7.1 Sampling plan
7.2 Judgment Rule
7.3 Type test
8 Packaging, marking, delivery conditions
8.1 Packaging
8.2 Identification
8.3 Delivery conditions

1 Scope

This standard specifies the artificial quartz optical low-pass filter chip terminology and definition, classification, requirements, test methods, inspection rules and packaging,

Logo, delivery conditions.

This standard applies to artificial quartz optical low-pass filter chips.

2 normative reference documents

The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article

Pieces. For undated references, the latest edition (including all modifications) applies to this document.

GB/T 1185 Optical parts surface flaws

GB/T 2828.1-2012 Count Sampling Inspection Procedures Part 1. Inspection by batch (AQL)

Plan (ISO 2859-1..1999)

GB/T 2831 Surface deviation of optical parts

Test method for thickness and total thickness variation of silicon wafers GB/T GB/T 7895 artificial optics quartz crystal

Test method for artificial optics quartz crystal GB/T 7896-2008

3 terms and definitions

GB/T 7895, GB/T 1185 and GB/T 2831 and the following terms and definitions apply to this document. In order to facilitate

Use the following to repeat some of the above terms and definitions.

3.1 Optical low-pass filter chip opticallow-passfilterwafer; OLPFwafer

Made of quartz crystal and other materials, the monolithic or multi-chip combination and coating, so that a certain frequency below the optical signal components through, and inhibition

The frequency of the optical signal component above the optical substrate.

3.2 Effective area fixedqualityarea; FQA

Removing the crystal surface area of the wafer edge at a specific distance X. Refer to the area included in the dotted line in Figure 1.

Note. The boundary of the FQA usually refers to all points that are spaced from the edge of the wafer (including the reference edge).

[IEC 62276-2005, definition 3.7.1]

3.3 Inclusions

The crystal is immersed in the refractive index matching liquid, and the scattered light from the light source is used to observe the foreign matter visible in the artificial quartz crystal. The most common

The inclusions are pyroxene.

[GB/T 7895-2008, definition 3.6]

3.4 Stripe striae

In the artificial quartz crystal, the stripe-like defects observed in the local area of the crystal due to the change in the refractive index.

......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.

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