GB/T 32055-2015Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength dispersive spectroscopy (English PDF)

Foreword

This Standard was drafted as per the rules specified in GB/T 1.1-2009.

This Standard's translation equivalently adopts ISO 11938.2012 Microbeam Analysis -

Electron Probe Microanalysis - Methods for Elemental-Mapping Analysis Using

Wavelength Dispersive Spectroscopy (English Edition).

The Chinese documents that have corresponding relation to the international

documents normatively quoted in this Standard are as follows.

--- GB/T 6379.6-2009 Accuracy (Trueness and Precision) of Measurement Methods

and Results - Part 6. Use in Practice of Accuracy Values (ISO 5725-6.1944, IDT)

--- GB/T 20725-2006 Electron Probe Microanalysis Guidelines for Qualitative Point

Analysis by Wavelength Dispersive X-Ray Spectrometry (ISO 17470.2004, IDT)

--- GB/T 21636-2008 Microbeam Analysis - Electron Probe Micro Analysis (EPMA)

– Vocabulary (ISO 23833.2006, IDT)

--- GB/T 28634-2012 Microbeam Analysis - Electron Probe Microanalysis -

Quantitative Point Analysis for Bulk Specimen Using Wavelength Dispersive X-

Ray Spectroscopy (ISO 22489.2006, IDT)

--- GB/T 30705-2014 Microbeam Analysis - Electron Probe Microanalysis -

Guidelines for the Determination of Experimental Parameters for Wavelength

Dispersive Spectroscopy (ISO 14594.2003, IDT)

This Standard was proposed by and shall be under the jurisdiction of National

Technical Committee for Standardization of Microbeam Analysis (SAC/TC 38).

Drafting organizations of this Standard. Institute of mineral resources, Chinese

Academy of Geological Sciences; and Shanghai Institute of Ceramics, Chinese

Academy of Sciences.

Chief drafting staffs of this Standard. Chen Zhenyu, Li Xiangting, Zeng Yi, and Zhou

Jianxiong.

Microbeam Analysis - Electron Probe Microanalysis -

Methods for Elemental-Mapping Analysis Using

Wavelength Dispersive Spectroscopy

1 Scope

This Standard provides procedures for electron microprobe elemental mapping

analysis using wavelength dispersive spectrometry. The choice between mapping with

the electron beam moving digitally across the specimen (electron beam mapping) and

mapping with stage movement only (large-area mapping) is assessed. It describes five

types of data processing. the raw X-ray intensity data method, the k-value method, the

calibration method, the correlation method and the matrix correction method.

2 Normative References

The following documents are essential to the application of this document. For the

dated documents, only the versions with the dates indicated are applicable to this

document; for the undated documents, only the latest version (including all the

amendments) are applicable to this Standard.

GB/T 15247-2008 Microbeam Analysis - Electron Probe Microanalysis - Guidelines

for Determining the Carbon Content of Steels Using Calibration Curve Method (ISO

16592.2006, IDT)

GB/T 27025-2008 General Requirements for the Competence of Testing and

Calibration Laboratories (ISO/IEC 17025.2005, IDT)

ISO 5725-6 Accuracy (Trueness and Precision) of Measurement Methods and

Results Part 6. Use in Practice of Accuracy Values

ISO 14594 Microbeam Analysis Electron Probe Microanalysis - Guidelines for the

Determination of Experimental Parameters for Wavelength Dispersive

Spectroscopy

ISO 17470 Microbeam Analysis - Electron Probe Microanalysis - Guidelines for

Qualitative Point Analysts by Wavelength Dispersive X-Ray Spectrometry

ISO 22489 Microbeam Analysis - Electron Probe Microanalysis - Quantitative Point

Analysis for Bulk Specimens Using Wavelength Dispersive X Ray Spectroscopy

......