GB/T 23413-2009Determination of crystallite size and micro-strain of nano-materials - X-ray diffraction line broadening method (English PDF)

1 Scope

This standard specifies the nanomaterials to determine the grain size and micro-strain line width of X-ray diffraction method approach. This standard is adopted

Calculated using an approximate function method.

This standard applies to the determination of the grain size is generally not more than 100nm, microscopic strain is generally not more than 0.1% of the nanomaterials.

2 Normative references

The following documents contain provisions which, through reference in this standard and become the standard terms. For dated references, subsequent

Amendments (not including errata content) or revisions do not apply to this standard, however, encourage the parties to the agreement are based on research

Whether the latest versions of these documents. For undated reference documents, the latest versions apply to this standard.

GB W (E) 130014 X-ray powder diffraction silicon Standards

GB W (E) 130016 X-ray diffractometer with alpha-SiO2 Calibration Standards

3 Symbol

The standard formula symbols used have the following meanings.

Dhkl. along the crystal face (hkl) in the normal direction of the grain size in nanometers (nm);

epsilon. microscopic strain, with the rms value, which indicates the degree of material within the microscopic lattice distortion;

epsilonhkl. microscopic strain along the crystal plane (hkl) in the normal direction;

lambda. wavelength of the incident X-rays, in units of nanometers (nm);

B. hologram linear integral width radians;

B0. Kalpha2 after peeling hologram linear integral width radians;

Chou. standard sample linear diffraction integral width radians;

Chou 0. standard sample after peeling Kalpha2 linear diffraction integral width (width of the instrument, also known as geometric or width) radians;

beta. Due to the physical broadening effect caused by the diffraction line broadening integral width radians;

. After peeling Kalpha2 integrated linear diffraction half-width in radians;

M1. due to diffraction line width of the integral width grain refinement caused radians;

Appearance. Diffraction line width of the integral width due to the strain caused by microscopic radians;

zeta. plot than half, some linear diffraction integral width and half-height width ratio;

theta. Bragg (Bragg) angles, in degrees;

thetahkl. Prague (Bragg) angles, in degrees;

M (2theta). grain size refinement by the diffraction effect of widening linear;

N (2theta). widening of microscopic strain effect linear diffraction;

K. with the grain shape and Miller index (hkl) related constant, and its value is close to 1, this standard is taken as 1.