GB/T 22461.2-2023Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning probe microscopy (English PDF)

1 Scope

This document defines the terms of scanning probe microscopy in the field of surface chemical analysis and gives a list of relevant abbreviations (see Appendix A):

This document is applicable to the teaching, scientific research, design, manufacture, preparation of relevant technical documents and documents related to scanning probe microscopy in surface chemical analysis:

Books and technical exchanges:

2 Normative references

This document has no normative references:

3 Scanning Probe Microscopy Terminology

3:1

< SNOM > Microscopy using a near-field (5:88) light source to obtain Raman spectra: This method illuminates the sample surface with appropriately polarized light, and

The metal probe tip (5:120) is placed in the near field area of the sample surface:

3:2

Atomic force microscopy atomic-forcemicroscopy; AFM Surface imaging methods that mechanically scan surface profiles: Install the sharp probe tip (5:120) on the flexible cantilever beam (5:18) to

The probe senses the surface force and then detects deflection of the probe:

NOTE 1 AFM is capable of highly quantitative imaging of insulating or conducting surfaces (5:69):

Note 2: Some atomic force microscopes fix the position of the probe tip and move the sample along the x, y, z directions; others fix the sample position

Position and move the probe tip:

Note 3: AFM can be used in environments such as vacuum, liquid phase, controlled atmosphere or air: Original images can be obtained on suitable samples with a sharp tip and appropriate imaging sub-resolution:

Note 4: A wide variety of forces can be measured, including normal force (5:91), and lateral force (5:77), frictional force (5:62) or shear force: The technical points corresponding to the latter three

Also known as lateral force microscopy (3:13), friction microscopy (3:11), shear force microscopy (3:37): AFM is a general term whose scope covers appendices

Microscopy of various force measurements in A:

Note 5: AFM can be used to measure the surface normal force of each pixel in the imaging area:

Note 6: Normally, for an atomic force microscope probe whose tip radius is less than 100nm, the normal force needs to be less than 0:1µN, and the specific value depends on the sample material

Otherwise, it will cause irreversible deformation of the surface and excessive wear of the probe tip:

3:3 chemical force microscopy chemical-forcemicroscopy; CFM LFM (3:13) or AFM (3:2) mode, detect the interaction between the functionalized modified sharp probe tip (5:120) and specific molecules resulting deviation:

Note: LFM (3:13) is the most commonly used mode: