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GB/T 22319.9-2018Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units (English PDF)

石英晶体元件参数的测量 第9部分:石英晶体元件寄生谐振的测量

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Issued by

State Administration for Market Regulation, China National Standardization Administration

Level / Type

National · Recommended

Issue date

March 15, 2018

Implementation date

October 1, 2018

Scope

GB/T 22319.9-2018 is the English-translated version of 石英晶体元件参数的测量 第9部分:石英晶体元件寄生谐振的测量.

GB/T 22319.9-2018 is Part 9 of GB/T 22319 and specifies two ways of measuring the spurious, unwanted resonances of a quartz crystal unit.

Method A, the full parameter measurement, determines the equivalent electrical parameters of the spurious resonance on equipment of the same principle as that of IEC 60444-5, and is the preferred way for low and medium impedances up to a few thousand ohms.

Method B, the resistance measurement, is for high impedance spurious resonances such as those of filter crystals; it uses the same equipment with a fixture of commercial microwave parts, a 180 degree hybrid coupler of accurate 50 ohm system impedance and a 10 dB attenuator.

The document also gives the multi-resonance equivalent circuit. An identical translation of IEC 60444-9:2007, it was issued on 15 March 2018 and has applied since 1 October 2018.

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Document preview — GB/T 22319.9-2018

National Standard of the People's Republic of China

ICS
31.140
Classification
L 21

Issued by: State Administration for Market Regulation, China National Standardization Administration

Contents

  • Foreword
  • 1 Scope
  • 2 Overview

Foreword

GB/T 22319 "Measurement of Quartz Crystal Element Parameters" is divided into the following parts.

--- Part 1: Basic method for measuring the resonant frequency and resonant resistance of a quartz crystal element using the pi-network zero-phase method;

--- Part 2: The phase offset method for measuring the dynamic capacitance of a quartz crystal element;

---Part 4: Measurement methods for load resonance frequency and load resonance resistance RL for quartz crystal elements with frequency up to 30 MHz and others The calculation of the derived parameter;

--- Part 5: Methods for determining equivalent electrical parameters using automatic network analysis techniques and error correction;

--- Part 6: Measurement of stimulus level correlation (DLD);

--- Part 7: Measurement of the activity jump of quartz crystal elements;

--- Part 8: Measurement fixtures for surface mounted quartz crystal components;

--- Part 9: Measurement of spurious resonance of a quartz crystal element;

---Part 11: Standard for Determining Load Resonance Frequency and Equivalent Load Capacitance Using Automatic Network Analysis Technique and Error Correction method.

This part is Part 9 of GB/T 22319.

This section was drafted in accordance with the rules given in GB/T 1.1-2009.

This section uses the translation method equivalent to the use of IEC 60444-9:2007 "Quartz crystal element parameters measurement - Part 9: Quartz crystal element Parasitic resonance measurement." This section made the following editorial changes.

--- Chapter 1 Paragraph 1 "This part improves and improves the reproducibility and accuracy of measurement compared to earlier methods." and below In the bridge measurement method specified in the "Early Quartz Resonator Response Measurement Method", a method that cannot meet reproducibility requirements was used. Components such as variable resistors and hybrid transformers. "Instead of a note, and removed the following" Is no longer on sale";

--- The last "method of method B in Chapter 1 is an improvement of the "baseline method" in the early standard." Instead, it is given in the form of a note;

---3.1.1c) Chinese (14) The following "if the amplitude of these two data points are greater than Qmax" is replaced by "if the amplitude of these two data points are large In Qmin".

1 Scope

This part of GB/T 22319 specifies two methods of measuring the parasitic (useless) resonance of a quartz crystal element.

Note: Compared with earlier methods, this part improves and improves the reproducibility and accuracy of the measurement. In the early prescribed method of bridge measurement, the use of a Components that require reproducibility, such as variable resistors and hybrid transformers.

Method A (all parameter measurement method)

The parametric measurement method can determine the equivalent electrical parameters of the spurious resonance. This method uses a measuring device with the same principle as IEC 60444-5.

This method is a preferred measurement method that can be used to measure low-to-medium impedance parasitic resonances up to several thousand ohms.

Method B (resistance measurement method)

Resistance measurements should be used to measure high-impedance spurious resonances as specified, such as certain filtered crystals. This method uses method A The same measuring equipment is connected with the specified test fixture, which is composed of commercially available microwave components, such as having an accurate 50 ohm System impedance of 180° hybrid coupler and 10dB attenuator.

Note: This method is an improvement over the "benchmarking method" used in earlier standards.

2 Overview

Quartz crystal elements can exhibit multiple resonances, which can be represented in parallel with multiple series resonant circuits. Complete quartz crystal element single-ended The equivalent circuit is shown in Figure 1 (derived from IEC 60444-5).

Therefore, the total admittance Ytot of the equivalent circuit of n resonances is expressed by Equation (1). In the formula:

Ytot --- total admittance of the equivalent circuit, the unit is Siemens (S);

......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 24 pages — is available in the English PDF.

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