GB/T 17626.36-2024Electromagnetic compatibility - Testing and measurement techniques - Part 36: Intentional electromagnetic interference immunity test methods for equipment and systems (English PDF)
电磁兼容 试验和测量技术 第36部分:设备和系统的有意电磁干扰抗扰度试验方法
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Issued by
State Administration for Market Regulation, China National Standardization Administration
Level / Type
National · Recommended
Issue date
November 28, 2024
Implementation date
June 1, 2025
Scope
GB/T 17626.36-2024 is the English-translated version of 电磁兼容 试验和测量技术 第36部分:设备和系统的有意电磁干扰抗扰度试验方法.
GB/T 17626.36-2024 — This document describes the method for determining test levels used to evaluate the immunity of equipment and systems to intentional electromagnetic interference (IEMI) sources.
This paper discusses general IEMI issues, IEMI source parameters, derivation of test limits, and summarizes practical test methods.
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Document preview — GB/T 17626.36-2024
National Standard of the People's Republic of China
- ICS
- 33.100.20
- Classification
- L 06
Issued by: State Administration for Market Regulation, China National Standardization Administration
Contents
- Preface
- Introduction
- 1 Scope
- 2 Normative references
- 3 Terms, definitions and abbreviations
- 3.1 Terms and Definitions
- 3.2 Abbreviations
- 4 Overview
- 5 IEMI environment and role
- 5.1 Overview
- 5.2 IEMI Environment
- 5.2.1 Technical capability grouping
- 5.2.2 IEMI deployment plan
- 5.2.3 Radiated IEMI Environment Summary
- 5.2.4 Published Conducted IEMI Environment
- 5.3 Effects on disturbed equipment, systems and devices
- 5.3.1 Overview
- 5.3.2 Protection level
- 6 Test methods
- 6.1 Derivation of applicable test methods
- 6.2 Derivation of transfer function
- 6.3 Radiation testing using IEMI simulator
- 6.4 Radiation test using a mixing chamber
- 6.5 Complex Waveform Injection (CWI)
- 6.6 Damped Sine Wave Injection (DSI)
- 6.7 Electrostatic Discharge (ESD)
- 6.8 Electrical Fast Transient (EFT)
- 6.9 Antenna Port Injection
- 7 Test parameters
- 7.1 Derivation of immunity test parameters
- 7.2 Radiation test parameters
- 7.2.1 General UWB test parameters (for skilled personnel)
- 7.2.2 General broadband test parameters (for skilled personnel)
- 7.2.3 General narrowband test parameters (for skilled personnel)
- 7.3 General Conducted IEMI Test Parameters
- 7.3.1 General requirements
- 7.3.2 Characteristics and performance of fast damped oscillatory wave generator
- 7.4 Derivation of specific test levels
- 7.5 Relevance of EMC Immunity Data
- Appendix A (Informative) Failure mechanism and performance criteria
- A.1 Overview
- A.2 Failure mechanism
- A.2.1 Overview
- A.2.2 Noise
- A.2.3 Parameter offset and drift
- A.2.4 System failure or crash
- A.2.5 Component damage
- A.3 Effect of pulse width
- A.4 Performance criteria
- A.5 References
- Appendix B (Informative) Development of IEMI Source Environment
- B.1 Overview
- B.2 IEMI Environment
- B.3 IEMI Sources
- B.4 Published Radiated IEMI Environment
- B.4.1 IEC 61000-2-13[B.14]
- B.4.2 Mil-Std-464C
- B.4.3 Parameter selection for broadband immunity test
- B.4.4 International Telecommunication Union (ITU)
- B.5 Summary
- B.6 References
- Appendix C (Informative) Interaction with Buildings
- C.1 Attenuation of buildings
- C.2 Coupling with cables
- C.3 Low voltage cable attenuation
- C.4 References
- Appendix D (Informative) Relationship between plane wave immunity test and reverberation chamber immunity test
- D.1 Overview
- D.2 Relationship between shielding effectiveness measurements in two environments
- D.3 Relationship between immunity tests in two environments
- D.4 Supplementary content
- D.5 References
- Appendix E (Informative) Complex waveform injection-test method
- E.1 Overview
- E.2 Prediction
- E.2.1 Overview
- E.2.2 Example
- E.3 Structure
- E.4 Injection test
- E.5 Summary
- E.6 References
- Appendix F (Informative) Importance of test method margin
- F.1 Overview
- F.2 Example
- F.2.1 Overview
- F.2.2 Negative Contribution
- F.2.3 Positive contribution
- F.2.4 Summary
- F.3 References
- Appendix G (Informative) Intentional EMI---The Problem of Jammers
- G.1 Overview
- G.2 Effect
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1: Structure and drafting rules for standardization documents" Drafting.
This document is part 36 of GB/T (Z) 17626 "Electromagnetic compatibility test and measurement technology". GB/T (Z) 17626 has been published the following parts.
---GB/Z 17626.1-2024 Electromagnetic compatibility test and measurement technology Part 1: General introduction to immunity test;
---GB/T 17626.2-2018 Electromagnetic compatibility test and measurement technology Electrostatic discharge immunity test;
---GB/T 17626.3-2023 Electromagnetic compatibility test and measurement technology Part 3: Radio frequency electromagnetic field radiated immunity test;
---GB/T 17626.4-2018 Electromagnetic compatibility test and measurement technology Electrical fast transient pulse group immunity test;
---GB/T 17626.5-2019 Electromagnetic compatibility test and measurement technology surge (impact) immunity test;
---GB/T 17626.6-2017 Electromagnetic compatibility test and measurement technology Radio frequency field induced conducted disturbance immunity;
---GB/T 17626.7-2017 Electromagnetic compatibility test and measurement technology Power supply system and connected equipment harmonic and interharmonic measurement Guidelines for volume and measuring instruments;
---GB/T 17626.8-2006 Electromagnetic compatibility test and measurement technology Power frequency magnetic field immunity test;
---GB/T 17626.9-2011 Electromagnetic compatibility test and measurement technology pulse magnetic field immunity test;
---GB/T 17626.10-2017 Electromagnetic compatibility test and measurement technology Damped oscillating magnetic field immunity test;
---GB/T 17626.11-2023 Electromagnetic compatibility test and measurement technology Part 11: For each phase input current less than or equal to Voltage sag, short interruption and voltage variation immunity test for 16A equipment;
---GB/T 17626.12-2023 Electromagnetic compatibility test and measurement techniques Part 12: Ringing wave immunity test;
---GB/T 17626.13-2006 Electromagnetic compatibility test and measurement technology AC power port harmonics, interharmonics and power grid signal Low frequency immunity test of signal;
---GB/T 17626.14-2005 Electromagnetic compatibility test and measurement technology Voltage fluctuation immunity test;
---GB/T 17626.15-2011 Electromagnetic compatibility test and measurement technology Flicker meter function and design specification;
---GB/T 17626.16-2007 Electromagnetic compatibility test and measurement technology 0Hz~150kHz common mode conducted disturbance immunity test;
---GB/T 17626.17-2005 Electromagnetic compatibility test and measurement technology DC power supply input port ripple immunity test;
---GB/T 17626.18-2016 Electromagnetic compatibility test and measurement technology Damped oscillation wave immunity test;
---GB/T 17626.19-2022 Electromagnetic compatibility test and measurement technology Part 19: AC power port 2kHz~ 150kHz differential mode conducted disturbance and communication signal immunity test;
---GB/T 17626.20-2014 Electromagnetic compatibility test and measurement technology Transverse electromagnetic wave (TEM) emission and immunity in waveguide Degree test;
---GB/T 17626.21-2014 Electromagnetic compatibility test and measurement technology mixing chamber test method;
---GB/T 17626.22-2017 Electromagnetic compatibility test and measurement technology Radiated emission and immunity in full anechoic chamber Measurement;
---GB/T 17626.24-2012 Electromagnetic compatibility test and measurement technology Test of HEMP conducted disturbance protection device method;
---GB/T 17626.27-2006 Electromagnetic compatibility test and measurement technology Three-phase voltage unbalance immunity test;
---GB/T 17626.28-2006 Electromagnetic compatibility test and measurement technology Power frequency change immunity test;
---GB/T 17626.29-2006 Electromagnetic compatibility test and measurement technology DC power input port voltage drop, short-term Interference immunity test of interruption and voltage variation;
---GB/T 17626.30-2023 Electromagnetic compatibility test and measurement technology Part 30: Power quality measurement method;
---GB/T 17626.31-2021 Electromagnetic compatibility test and measurement technology Part 31: Broadband conducted harassment of AC power ports Interference immunity test;
---GB/Z 17626.33-2023 Electromagnetic compatibility test and measurement technology Part 33: High power transient parameter measurement method;
---GB/T 17626.34-2012 Electromagnetic compatibility test and measurement technology Equipment with main power supply current greater than 16A per phase Voltage sag, short interruption and voltage variation immunity test;
Interference immunity test method;
---GB/T 17626.39-2023 Electromagnetic compatibility test and measurement technology Part 39: Close-range radiated field immunity test.
This document is equivalent to IEC 61000-4-36:2020 "Electromagnetic compatibility (EMC) Part 4-36.Test and measurement technology equipment and "Test method for immunity to intentional electromagnetic disturbance of systems".
The following minimal editorial changes were made to this document.
--- In order to coordinate with the existing standards, the name of the standard is changed to "Electromagnetic compatibility test and measurement technology Part 36: Equipment and system Intentional electromagnetic interference immunity test method";
--- To be consistent with the references, the reference to IEC 60050-161:2018 in Chapter 3 is corrected to IEC 60050-161.
1990, the international standard is wrong.
Introduction
Electromagnetic compatibility refers to the ability of electrical and electronic equipment or systems to work properly in their electromagnetic environment and not cause any adverse effects on anything in the environment.
The electromagnetic compatibility problem is one of the important factors affecting the environment and product quality. Its standardization work has attracted in this regard, the IEC 61000 series of standards developed by the International Electrotechnical Commission (IEC) is a key standard for the manufacturing and information industries.
General standards in the fields of industry, electrical engineering and energy, transportation, social services and health, consumer product quality and safety, etc.
There are six categories. description, environment, limit, test and measurement technology, installation and mitigation guidelines, and general standards. my country has carried out research on this series of standards.
Domestic transformation work has been carried out and a corresponding national standard system has been established.
In this standard system, GB/T (Z) 17626 "Electromagnetic compatibility test and measurement technology" is about the test and measurement in the field of electromagnetic compatibility.
The basic technical standards are intended to describe the immunity test of electromagnetic compatibility phenomena such as conducted disturbance and radiated disturbance, etc., and are planned to be composed of 39 Partial composition.
--- Part 1: General introduction to immunity test. The purpose is to provide usability guidance on the test and measurement techniques in the electromagnetic compatibility standard.
guidance and provides general advice on the selection of relevant tests.
--- Part 2: Electrostatic discharge immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical and electronic devices.
The performance of the device when subjected to electrostatic discharge.
--- Part 3: Radio frequency electromagnetic field radiation immunity test. The purpose is to establish the electrical and electronic equipment when it is subjected to radio frequency electromagnetic field radiation.
The basis for immunity assessment.
--- Part 4: Electrical fast transient burst immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical Immunity of power supply ports, signal, control and ground ports of electronic equipment when subjected to electrical fast transient pulse group interference performance.
--- Part 5: Surge (impact) immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical and electronic the immunity performance of the equipment when subjected to surge (impact).
--- Part 6: Immunity to conducted disturbances induced by radio-frequency fields. The purpose is to establish a common and reproducible benchmark to evaluate electrical and the immunity performance of electronic equipment when it receives conducted disturbances induced by radio frequency fields.
--- Part 7: Measurement and measurement instruments for harmonics and interharmonics of power supply systems and connected equipment. The purpose is to specify the equipment is tested item by item according to the emission limits given in certain standards, and the harmonic current and voltage in the actual power supply system are tested.
Instrument for measuring.
--- Part 8: Power frequency magnetic field immunity test. The purpose is to establish a common and reproducible benchmark to evaluate household, commercial and Immunity performance of industrial electrical and electronic equipment in power frequency (continuous and short-term) magnetic fields.
--- Part 9: Pulse magnetic field immunity test. The purpose is to establish a common and reproducible benchmark to evaluate residential, commercial and Immunity performance of industrial electrical and electronic equipment in pulsed magnetic fields.
--- Part 10: Damped oscillatory magnetic field immunity test. The purpose is to establish a common and reproducible benchmark to evaluate medium and high voltage Immunity performance of electrical and electronic equipment in substations exposed to damped oscillating magnetic fields.
--- Part 11: Voltage dips, short interruptions and voltage variations immunity test for equipment with input current less than or equal to 16A per phase the purpose is to establish a common and reproducible benchmark for evaluating the performance of electrical and electronic equipment when subjected to voltage dips, short interruptions, and voltage variation immunity performance.
--- Part 12: Ring wave immunity test. The purpose is to establish a common and reproducible benchmark to evaluate the the immunity performance of electrical and electronic equipment for residential, commercial and industrial use also applies to equipment in power stations and substations.
--- Part 13: Low frequency immunity test for harmonics, interharmonics and power grid signals at AC power ports. The purpose is to establish a common and reproducible benchmark to evaluate the low frequency immunity performance of electrical and electronic equipment to harmonics, interharmonics and mains signal frequencies.
--- Part 14: Voltage fluctuation immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical and electronic the immunity of a device when subjected to positive and negative low amplitude voltage fluctuations.
--- Part 15: Flicker meter function and design specifications. The purpose is to display the correct flicker for all practical voltage fluctuation waveforms Perception level.
--- Part 16.0Hz~150kHz common mode conducted disturbance immunity test. The purpose is to establish electrical and electronic equipment to withstand common General and repeatability criteria for mode conducted disturbance testing.
--- Part 17: DC power input port ripple immunity test. The purpose is to establish a common and reproducible benchmark for Under laboratory conditions, electrical and electronic equipment are tested on a DC power supply when the self-rectifying system and/or battery charging is superimposed Ripple voltage immunity test on the
--- Part 18: Damped oscillatory wave immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical and electronic the immunity performance of a sub-device when subjected to a damped oscillatory wave.
--- Part 19: AC power port 2kHz ~ 150kHz differential mode conducted disturbance and communication signal immunity test. The purpose is to Confirm that electrical and electronic equipment can withstand the loads from power electronics and power line communication systems (PLC) when operating in the public power grid.
Differential mode conducted interference.
--- Part 20: Transverse electromagnetic (TEM) waveguide emission and immunity test. The purpose is to give the performance of TEM waveguide, Method for confirming TEM waveguides for electromagnetic compatibility tests, test of radiated emission and immunity tests in TEM waveguides Test arrangements, procedures and requirements.
--- Part 21: Reverberation chamber test method. The purpose is to establish the use of reverberation chamber to evaluate electrical and electronic equipment in radio frequency electromagnetic fields General specification for the performance and determination of the radiated emission levels of electrical and electronic equipment.
--- Part 22: Radiated emission and immunity measurements in a fully anechoic chamber. The purpose is to specify the general confirmation procedures for radiated emissions and radiated immunity, test layout requirements for the equipment under test and full anechoic chamber measurement methods are provided.
--- Part 23: Test methods for HEMP and other radiation disturbance protection devices. The purpose is to describe the HEMP test Basic principles, as well as the theoretical basis (test concept), test configuration, required equipment, test procedures, data processing of protective element tests.
Important concepts such as theory.
--- Part 24: Test methods for HEMP conducted disturbance protection devices. The purpose is to specify the test methods for HEMP conducted disturbance protection devices.
The test method includes the voltage breakdown and voltage limiting characteristics test, as well as the residual voltage test when the voltage and current change rapidly.
Measurement method.
--- Part 25: Test methods for HEMP immunity of equipment and systems. The purpose is to establish a common and reproducible benchmark for when evaluating the HEMP radiation environment and the conducted transient disturbances it generates on power supply, antenna, I/O signal lines and control lines performance of electrical and electronic equipment.
--- Part 27: Three-phase voltage unbalance immunity test. The purpose is to test the electrical and electronic equipment under the condition of unbalanced power supply.
It establishes a reference for the immunity evaluation under pressure.
--- Part 28: Power frequency change immunity test. The purpose is to test the immunity of electrical and electronic equipment to power frequency changes.
Provide basis for immunity evaluation.
--- Part 29: Immunity test for voltage dips, short interruptions and voltage variations at DC power input ports. The purpose is to establish General criteria for evaluating the immunity of DC electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations.
--- Part 30: Power quality measurement methods. The purpose is to specify the measurement methods of power quality parameters in 50 Hz AC power supply systems and interpretation of measurement results.
--- Part 31: AC power port broadband conducted disturbance immunity test. The purpose is to establish a common benchmark to evaluate electrical Immunity of AC power ports of electronic equipment to conducted disturbances generated by intentional and/or unintentional broadband signal sources.
--- Part 32: Overview of High Altitude Electromagnetic Pulse (HEMP) Simulators. The purpose is to provide the current international system-level HEMP Simulators and the relevant information needed when they are used as immunity test and verification equipment.
--- Part 33: High power transient parameter measurement method. The purpose is to provide the measurement method and Information about feature parameters.
--- Part 34: Voltage dips, short interruptions and voltage variations immunity test for equipment with mains current greater than 16A per phase.
The purpose is to establish a general method for evaluating the immunity of electrical and electronic equipment to voltage dips, short interruptions and voltage variations.
Guidelines.
--- Part 35: Overview of High Power Electromagnetic (HPEM) Simulators. The purpose is to provide an overview of the existing system-level HPEM Wideband (narrow spectrum) and broadband (broad spectrum, sub-ultra-broad spectrum and ultra-broad spectrum) simulators and their use as immunity test and verification equipment Required relevant information.
--- Part 36: Test methods for the immunity of equipment and systems to intentional electromagnetic disturbances.
Immunity to sources of electromagnetic disturbance provides a means of determining the test level.
--- Part 37: Calibration and verification protocol for harmonic emission compliance test systems.
Laboratories and other organizations provide systematic guidance to define applicable compliance status within a certain range of harmonic current emissions.
--- Part 38: Test, verification and calibration protocol for voltage fluctuation and flicker compliance test systems.
Provide guidance and methods for regular calibration and verification of systems composed of equipment.
--- Part 39: Close-range radiated field immunity test. The purpose is to establish a common benchmark to evaluate exposure to close-range sources.
Immunity requirements for electrical and electronic equipment from radiated radio frequency electromagnetic fields.
--- Part 40: Digital measurement methods for modulated or distorted signal power. The purpose is to introduce two methods that are applicable to fluctuating or non-periodic loads.
A digital algorithm for measuring power quantity under load is proposed and the working principle of the proposed algorithm is explained.
Electromagnetic compatibility test and measurement technology Part 36: Intentional electromagnetic disturbances in equipment and systems Immunity test method
1 Scope
This document describes the method for determining test levels used to evaluate the immunity of equipment and systems to intentional electromagnetic interference (IEMI) sources.
This paper discusses general IEMI issues, IEMI source parameters, derivation of test limits, and summarizes practical test methods.
2 Normative references
This document has no normative references.
3 Terms, definitions and abbreviations
3.1 Terms and Definitions
The following terms and definitions apply to this document.
3.1.1
Attenuation
The reduction in the amplitude of the electric field, magnetic field, current or voltage due to absorption and scattering. The attenuation value is usually expressed in decibels (dB).
[Source. IEC 61000-2-13:2005[3]1),3.1]
1) Numbers in square brackets refer to reference numbers.
3.1.2
Bandratio
The ratio of the upper frequency limit to the lower frequency limit in the frequency band containing 90% of the energy.
Note. If the spectrum contains a large amount of DC components, the lower frequency limit is defined as 1 Hz.
[Source. IEC 61000-2-13:2005[3], 3.2, modified] 3.1.3 Band ratio of decades Frequency band ratio expressed in decades. decade frequency band ratio = lg (frequency band ratio).
[Source. IEC 61000-2-13:2005[3], 3.3] 3.1.4 Burst A finite number of clearly distinguishable trains of pulses or oscillations of limited duration.
NOTE When multiple bursts occur, the time between bursts is usually defined.
[Source. IEC 60050-161:1990[19], 161-02-07, with modifications]
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 79 pages — is available in the English PDF.
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Related Standards
GB/T 17626.1-2006 — [Replaced by GB/Z 17626.1-2024] Electromagnetic compatibility -- Testing and measurement techniques -- Overview of immunity tests
GB/T 17626.10-2017 — Electromagnetic compatibility -- Testing and measurement techniques -- Damped oscillatory magnetic field immunity test
GB/T 17626.13-2006 — Electromagnetic compatibility (EMC) - Testing and measurement techniques - Harmonics and inter-harmonics including mains signalling at a.c. power port low frequency immunity test
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