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GB/T 17554.3-2006Identification cards -- Test methods -- Part 3: Integrated circuit(s) cards with contacts and related interface devices (English PDF)

识别卡测试方法第3部分：带触点的集成电路卡及其相关接口设备

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Issued by

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China

Level / Type

National · Recommended

Issue date

March 14, 2006

Implementation date

July 1, 2006

Scope

GB/T 17554.3-2006 is the English-translated version of 识别卡测试方法第3部分：带触点的集成电路卡及其相关接口设备.

GB/T 17554.3-2006 — This standard defines the integrated circuit cards with contacts and related interface devices characteristics of the test method and GB/T 16649 to adapt the definition given for each test method cross- reference one or more base standards, these basic criteria may be GB/T 14916, it can be applied to one or more definitions of the card application in the identification information storage technology complementary standards.

This section defines only the IC cards with contacts and related interface devices characteristics of the test method, GB/T 17554.

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Document preview — GB/T 17554.3-2006

National Standard of the People's Republic of China

ICS: 35.240.15
Classification: L 64

Issued by: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China

What this standard covers1
Document data2

What this standard covers

This standard defines the integrated circuit cards with contacts and related interface devices characteristics of the test method and GB/T 16649 to adapt the definition given for each test method cross- reference one or more base standards, these basic criteria may be GB/T 14916, it can be applied to one or more definitions of the card application in the identification information storage technology complementary standards. This section defines only the IC cards with contacts and related interface devices characteristics of the test method, GB/T 17554. 1 is defined as one or more card technologies testing methods that are shared by the other part defines the various special technical testing methods.

Document data

International classification (ICS): 35.240.15.

Chinese classification (CCS): L64.

Estimated length of the Chinese original: 52,568 words.

Adopted international standard: ISO/IEC 10373-3-2001, MOD.

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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 35 pages — is available in the English PDF.

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Cited by

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