GB/T 17473.7-2022Test methods of precious metals pastes used for microelectronics - Part 7: Determination of solderability and solder leaching resistance (English PDF)
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Issued by
SAMR; SAC
Level / Type
National · Recommended
Issue date
January 1, 2022
Implementation date
January 1, 2022
Scope
GB/T 17473.7-2022 (Test methods of precious metals pastes used for microelectronics - Part 7: Determination of solderability and solder leaching resistance) is available as an English-translated PDF.
GB/T 17473.7-2022 is the Chinese standard "Test methods of precious metals pastes used for microelectronics - Part 7: Determination of solderability and solder leaching resistance".
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Document preview — GB/T 17473.7-2022
Contents
- [Preview only]
- 1 Scope
- 2 Method principle
- 2.1 Terms
- 2.2 Symbols
- 3 Material
- 4 Instruments and equipment
- 4.1 General requirements
- 5 Measurement procedure
- 6 Description of measurement results
- 6.1 Environmental conditions
- 6.2 Measurement standards and other equipment
- 7 Test report
- 7.1 Calibration Items
- 7.2 Calibration method
1 Foreword
GB/T 17473.7-2022 is issued by State Administration for Market Regulation; Standardization Administration of the PRC.
It replaces the earlier edition GB/T 17473.7-2008, GB/T 17473.7-1998.
It is one of 14 parts of the GB/T 17473 series.
2 Scope Preview
GB/T 17473.7-2022 carries no ICS number and no Chinese Standard Classification code.
This catalogue holds 75,626 other GB/T standards.
Of the 47,415 GB/T standards that do carry an ICS number, 3,437 (7%) fall under ICS 77, in the field of metallurgy.
3 About this standard
Issued by: State Administration for Market Regulation; Standardization Administration of the PRC
English translation: about 15 pages (approximate)
4 Related standards
Other parts of this standard:
GB/T 17473-2025 — Performance test method for electronic pastes - Conductor pastes test
GB/T 17473.1-1998 — Test methods of precious metal pastes used for thick film microelectronics--Determination of solids content
GB/T 17473.1-2008 — Determination of solids content
GB/T 17473.2-1998 — Test methods of precious metal pastes used for thick film microelectronics--Determination of fineness
GB/T 17473.2-2008 — Determination of fineness
GB/T 17473.3-1998 — Test methods of precious metal pastes used for thick film microelectronics--Determination of sheet resistance
GB/T 17473.3-2008 — Determination of sheet resistance
GB/T 17473.4-1998 — Test methods of precious metal pastes used for thick film microelectronics--Determination of adhesion
GB/T 17473.4-2008 — Determination of adhesion
GB/T 17473.5-1998 — Test methods of precious metal pastes used for thick film microelectronics--Determination of viscosity
GB/T 17473.5-2008 — Determination of viscosity
GB/T 17473.6-1998 — Test methods of precious metal pastes used for thick-film microelectronics--Determination of resolution
GB/T 17473.6-2008 — Test methods of precious metal pastes used for microelectronics -- Determination of resolution
Other editions:
GB/T 17473.7-2008 (earlier edition)
GB/T 17473.7-1998 (earlier edition)
5 Classification and status
Prefix GB/T: recommended standard.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 15 pages — is available in the English PDF.
Referenced standards
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Related Standards
GB/T 17473.6-1998 — Test methods of precious metal pastes used for thick-film microelectronics--Determination of resolution
GB/T 17473.6-2008 — Test methods of precious metal pastes used for microelectronics -- Determination of resolution
GB/T 17473.5-1998 — Test methods of precious metal pastes used for thick film microelectronics--Determination of viscosity
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GB/T 17473.7-2022
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