YS/T 516-2012Determination method for secondary recrystallization temperature of tungsten wire (English PDF)
钨丝二次再结晶温度测量方法
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Issued by
Ministry of Industry and Information Technology
Level / Type
National · Recommended
Issue date
May 24, 2012
Implementation date
November 1, 2012
Scope
YS/T 516-2012 is the English-translated version of 钨丝二次再结晶温度测量方法.
YS/T 516-2012 — This standard specifies the secondary tungsten recrystallization temperature measurement method. This standard applies to phi0.35mm ~ phi1.0mm doped tungsten secondary recrystallization temperature measurement.
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Document preview — YS/T 516-2012
National Standard of the People's Republic of China
- ICS
- 77.120.99
- Classification
- H 63
- Replacing
- YS/T 516-2006
Issued by: Ministry of Industry and Information Technology
Contents
- What this standard covers1
- Document data2
What this standard covers
This standard specifies the tungsten secondary recrystallization temperature measurement method. This standard applies to ��0. 35mm ~ ��1. 0mm doped tungsten secondary recrystallization temperature measurement.
Document data
International classification (ICS): 77.120.99.
Chinese classification (CCS): H63.
Estimated length of the Chinese original: 7,729 words.
Supersedes the earlier edition YS/T 516-2006.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 5 pages — is available in the English PDF.
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YS/T 516-2012
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