YS/T 473-2005Determination of impurity elements in gallium for industrial use-ICP-MS analytical method (English PDF)
工业镓化学分析方法杂质素的测定 电感耦合等离子体质谱法
YS/T 473 | Evolution and historical versions
| Std ID | Title | Status |
|---|---|---|
| YS/T 473-2015 | Methods for chemical analysis industrial gallium―Determination of impurity elements―ICP-MS analytical method | Valid |
| YS/T 473-2005 | Determination of impurity elements in gallium for industrial use-ICP-MS analytical method | Obsolete |
YS/T 473-2005 is obsolete. It has been replaced by YS/T 473-2015. This page sells the obsolete edition, for projects and contracts that still cite it.
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Issued by
National Development and Reform Commission
Level / Type
National · Recommended
Issue date
May 18, 2005
Implementation date
December 1, 2005
Scope
YS/T 473-2005 is the English-translated version of 工业镓化学分析方法杂质素的测定 电感耦合等离子体质谱法.
YS/T 473-2005 is the Chinese industry standard "Determination of impurity elements in gallium for industrial use-ICP-MS analytical method". It was issued on May 18, 2005 by the National Development and Reform Commission, and took effect on December 1, 2005. It is obsolete: it has been replaced by YS/T 473-2015.
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Document preview — YS/T 473-2005
National Standard of the People's Republic of China
Issued by: National Development and Reform Commission
Contents
- Document data
1 Document data
Sector: National Recommended (industry standard).
Issuing body: National Development and Reform Commission.
Date of issue: 2005-05-18.
Date of implementation: 2005-12-01.
Status: obsolete, replaced by YS/T 473-2015.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.
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YS/T 473-2005
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