YS/T 26-1992Test method for silicon wafer edge (English PDF)
硅片边缘轮郭检验方法
YS/T 26 | Evolution and historical versions
| Std ID | Title | Status |
|---|---|---|
| YS/T 26-2016 | Test methods for edge contour of silicon wafers | Valid |
| YS/T 26-1992 | Test method for silicon wafer edge | Obsolete |
YS/T 26-1992 is obsolete. It has been replaced by YS/T 26-2016. This page sells the obsolete edition, for projects and contracts that still cite it.
This is a limited preview
Buy now to download the full PDF
Need quotation for your management?
Get a formal quotation for YS/T 26-1992 in 30 minutes.
Issued by
China Nonferrous Metals Industry Corporation
Level / Type
National · Recommended
Issue date
March 9, 1992
Implementation date
January 1, 1993
Scope
YS/T 26-1992 is the English-translated version of 硅片边缘轮郭检验方法.
YS/T 26-1992 is the Chinese industry standard "Test method for silicon wafer edge". It was issued on March 9, 1992 by China Nonferrous Metals Industry Corporation, and took effect on January 1, 1993. It is obsolete: it has been replaced by YS/T 26-2016.
Found what you need?
Document preview — YS/T 26-1992
National Standard of the People's Republic of China
Issued by: China Nonferrous Metals Industry Corporation
Contents
- Document data
1 Document data
Sector: National Recommended (industry standard).
Issuing body: China Nonferrous Metals Industry Corporation.
Date of issue: 1992-03-09.
Date of implementation: 1993-01-01.
Status: obsolete, replaced by YS/T 26-2016.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.
How to Download YS/T 26-1992
- 1
Add to cart
Click "Download PDF" on this page and choose "Buy this standard". You can add more standards before checkout.
- 2
Checkout
Enter your email and billing details. Payment is processed securely by Stripe (cards or bank transfer). Prefer bank details? Request a quotation (min. order $300).
- 3
Instant delivery (0–9 sec)
Delivery is automatic: within seconds of payment you'll receive an email with a secure download link. The link stays valid for 72 hours.
- 4
Invoice included
A tax invoice is attached to the confirmation email. Need a custom invoice? Contact us.
Related Standards
YS/T 1115.10-2026 — Chemical analysis methods of copper, lead and zinc ores and tailings - Part 10: Determination of gold, silver, molybdenum, arsenic, tungsten, bismuth, gallium, indium, thallium, selenium, tellurium and germanium contents - Inductively coupled plasma mass spectrometry
YS/T 1115.7-2026 — Methods for chemical analysis of copper, lead, zinc ores and tailings - Part 7: Determination of molybdenum content - Thiocyanate spectrophotometric method
YS/T 1115.8-2026 — Methods for chemical analysis of copper, lead, zinc ores and tailings - Part 8: Determination of fluorine content - Ion-selective electrode method and ion chromatography
Secure payment via Stripe
Payments accepted
YS/T 26-1992
$55.00