YS/T 1160-2016Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction (English PDF)
工业硅粉定量相分析 二氧化硅含量的测定 x射线衍射k值法
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Issued by
Ministry of Industry and Information Technology
Level / Type
National · Recommended
Issue date
July 11, 2016
Implementation date
January 1, 2017
Scope
YS/T 1160-2016 is the English-translated version of 工业硅粉定量相分析 二氧化硅含量的测定 x射线衍射k值法.
YS/T 1160-2016 — This standard specifies the method for determining the silica content of industrial silicon powder. This standard applies to the determination of silica content in industrial silicon powder, the measurement range is >= 1%.
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Document preview — YS/T 1160-2016
National Standard of the People's Republic of China
- ICS
- 29.045
- Classification
- H 12
Issued by: Ministry of Industry and Information Technology
Contents
- What this standard covers1
- Document data2
What this standard covers
This standard specifies the method for determining the silica content of industrial silicon powder.
Document data
International classification (ICS): 29.045.
Chinese classification (CCS): H12.
Estimated length of the Chinese original: 7,751 words.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 5 pages — is available in the English PDF.
Referenced standards
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YS/T 1160-2016
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