SJ/Z 9154.2-1987Measurement of quartz crystal unit parameters by zero phase technique in a pi -network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (English PDF)
用π型网络零相位法测量石英晶体件参数 第二部分:测量石英晶体件动态电容的相位偏置法
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Issued by
Ministry of Industry and Information Technology
Level / Type
National · Recommended
Issue date
January 1, 1987
Implementation date
January 6, 1988
Scope
SJ/Z 9154.2-1987 is the English-translated version of 用π型网络零相位法测量石英晶体件参数 第二部分:测量石英晶体件动态电容的相位偏置法.
SJ/Z 9154.2-1987 is the Chinese standard "Measurement of quartz crystal unit parameters by zero phase technique in a pi -network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units".
This standard specifies a 1 ~ 125MHz element dynamic capacitance measuring method quartz, the total measurement error of about 5%. Advantages of this standard is that it only use SJ/Z 9154-87 (IEC 444) measuring circuit is described in the standard, without the need for additional components or equipment, which may be the source of error.
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Document preview — SJ/Z 9154.2-1987
National Standard of the People's Republic of China
- Classification
- L21
Contents
- Document data
1 Document data
Sector: Electronics Industry Standard.
Date of implementation: 1/6/1988.
Chinese Standard Classification: L21.
Length: about 7,790 characters in the Chinese original.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 8 pages — is available in the English PDF.
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SJ/Z 9154.2-1987
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