SJ/Z 3206.13-1989General rules for emision spectrum analysis for semiconductor materials (English PDF)
半导体材料发射光谱分析方法通则
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Issued by
Ministry of Industry and Information Technology
Level / Type
National · Recommended
Issue date
February 10, 1989
Implementation date
March 1, 1989
Scope
SJ/Z 3206.13-1989 is the English-translated version of 半导体材料发射光谱分析方法通则.
SJ/Z 3206.13-1989 is the Chinese standard "General rules for emision spectrum analysis for semiconductor materials". Issued on 2/10/1989, in force from 3/1/1989.
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Document preview — SJ/Z 3206.13-1989
National Standard of the People's Republic of China
- Classification
- L90
Contents
- Document data
1 Document data
Sector: Electronics Industry Standard.
Date of issue: 2/10/1989.
Date of implementation: 3/1/1989.
Chinese Standard Classification: L90.
Length: about 7,744 characters in the Chinese original.
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This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — 8 pages — is available in the English PDF.
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Related Standards
SJ/Z 3206.14-1989 — General rules for error in spectrum chemical analysis and data processing in laboratories
SJ/Z 3206.12-1989 — General rules for emission spectrum analysis for vacuum materials
SJ/Z 3206.9-1989 — Methods for inspection of standard samples or sample uniformity
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SJ/Z 3206.13-1989
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