SJ 2595-1985Method for the analysis of trace phosphorous in pure SiC14 - Method spectrophotometry (English PDF)
高纯四氯化硅中痕量磷的分光光度比色测试方法
SJ 2595 | Evolution and historical versions
| Std ID | Title | Status |
|---|---|---|
| SJ 2595-1985 | Method for the analysis of trace phosphorous in pure SiC14 - Method spectrophotometry | Obsolete |
SJ 2595-1985 is obsolete. This page sells the obsolete edition, for projects and contracts that still cite it.
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Issued by
MOEI
Level / Type
National · Mandatory
Issue date
July 31, 1985
Implementation date
January 1, 1986
Scope
SJ 2595-1985 is the English-translated version of 高纯四氯化硅中痕量磷的分光光度比色测试方法.
SJ 2595-1985 is the Chinese industry standard "Method for the analysis of trace phosphorous in pure SiC14 - Method spectrophotometry". It was issued on July 31, 1985 by MOEI, and took effect on January 1, 1986. It is obsolete: it has been withdrawn (abolished on July 11, 2024).
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Document preview — SJ 2595-1985
National Standard of the People's Republic of China
Issued by: MOEI
Contents
- Document data
1 Document data
Sector: Electronics (industry standard).
Issuing body: MOEI.
Date of issue: 1985-07-31.
Date of implementation: 1986-01-01.
Status: obsolete, withdrawn on 2024-07-11.
......
This preview omits tables, figures, formulas and parts of the technical clauses. The complete document — all pages — is available in the English PDF.
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SJ 2595-1985
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